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The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and research applications.
| Description | 200 kV TEM and STEM microscope |
| Type | STEM Microscope |
| Résolution | ≤0.16 nm |
| Unit Size | Each |
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| Référence | Spécifications | Taille unitaire | Prix (EUR) | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| TALOS-F200E-TEM | Each | Demander un devis | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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- High-throughput, multi-purpose TEM with low-distortion imaging for a wide range of applications
- 200 kV TEM and STEM for repeatable, high-volume analysis of a broad range of semiconductor and microelectronic devices.
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