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X-ray photoelectron spectroscopy (XPS) is a powerful surface analysis technique for understanding the elemental composition, chemical states, and electronic properties of surfaces, thin films, and engineered interfaces.
Download our practical guide to XPS for research and industry to explore the fundamentals of the technique, modern instrumentation and analytical methods, sample handling, depth profiling, complementary techniques, and applications across advanced materials. The guide also includes real-world case studies and practical considerations for selecting the right XPS system for your analytical needs.
Inside the guide
- Introduction to XPS and its fundamental principles
- XPS instrumentation and sample handling
- Analytical methods, including imaging, mapping, and angle-resolved XPS
- Depth profiling with monatomic ions, gas-cluster ion sputtering, and femtosecond laser ablation
- Complementary techniques including UPS, REELS, ISS, Raman spectroscopy, and AES
- XPS applications across semiconductors, batteries, polymers and coatings, catalysis, corrosion, 2D materials, and more
- Application case studies
- Guidance for choosing an XPS system and depth-profiling approach