The 5th-generation Thermo Scientific Phenom Pro Desktop SEM is the high-end imaging desktop scanning electron microscope (SEM). Its unique design makes it suitable for use in a wide variety of applications and markets. With custom-made detection hardware, a high-brightness source and a state-of-the-art color navigation camera, it is an extremely powerful desktop SEM.

The Phenom Pro Desktop SEM offers high-brightness imaging with up to 8 nm resolution. You are now able to address a wider range of applications, including samples sensitive to electron beam irradiation.

The zoom functionality of the color navigation camera narrows the gap between optical and SEM imaging. The Phenom Pro Desktop SEM can be upgraded to Phenom ProX functionality with energy dispersive X-ray spectroscopy (EDS) or equipped with the Phenom ProSuite application platform. Also, an optional secondary electron (SE) detector is available.

Key Features

Reliable navigation and ease-of-use

The color navigation camera in the Phenom Pro Desktop SEM provides information that helps you make the link between optical and electron optical images. Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a range of samples. Sample loading is fast and easy thanks to our patented sample vacuum loading technology.

Phenom ProSuite

Thermo Scientific Phenom ProSuite Software is an optional software application platform that has been developed to further enhance the capabilities of the Phenom desktop SEM. Phenom ProSuite Software enables maximum information to be extracted from images obtained on the Phenom Pro Desktop SEM. 

Secondary electron detector

A secondary electron detector (SED) is optionally available on the Phenom Pro Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. 


Specifications

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Light optical magnification

  • 20-134x

Electron optical magnification range

  • 80–150,000x

Resolution

  • ≤ 8 nm SED and ≤ 10 nm BSD

Digital zoom

  • Max. 12x

Light optical navigation camera

  • Color

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 15.0 kV imaging mode
  • 20 kV available (optional)

Vacuum modes

  • High vacuum mode
  • Charge reduction mode (low vacuum mode)

Detector

  • Backscattered electron detector (standard)
  • Energy dispersive X-ray spectroscopy detector (optional)
  • Secondary electron detector (optional)

Sample size

  • Up to 25 mm diameter
  • 32 mm (optional)

Sample height

  • Up to 35 mm
  • 100 mm (optional)
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Applications

Process Control_Thumb_274x180_144DPI

Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

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To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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