Electron Microscopy Products

Scanning electron microscopy (SEM) has become an essential tool across materials science, life sciences, forensics, semiconductor analysis and industrial manufacturing. SEM provides detailed surface and near-surface imaging, making it indispensable for researchers and engineers who require high-resolution analysis. Thermo Fisher Scientific offers a range of SEM instruments, from high-resolution floor models to environmental SEMs (ESEMs) and compact desktop systems, helping to ensure precision and versatility for various applications.
 

For detailed imaging and contrast, Thermo Scientific Verios and Apreo SEMs set the industry standard. These high-performance instruments deliver sub-nanometer resolution, capturing fine structural details for advanced materials research, nanotechnology, biological research, and failure analysis. 
 

ESEM technology enables imaging of biological and other sensitive samples in their natural, hydrated state without the need for dehydration or extensive preparation. The Thermo Scientific Prisma E and Quattro ESEMs excel in handling challenging samples, including those that charge, outgas or contain moisture. Featuring real-time elemental colorization with Thermo Scientific ChemiSEM Technology, these systems provide high-resolution imaging under diverse environmental conditions, making them ideally suited for biological research, material analysis, and multi-user labs.
 

Combining speed, ease of use, and high performance, Thermo Scientific Phenom Desktop SEMs offer a compact yet powerful solution for rapid imaging. Even novice users can obtain high-quality images within minutes thanks to an intuitive interface. The Thermo Scientific Phenom Pharos Desktop SEM, equipped with a field emission gun (FEG) source, delivers resolutions below three nanometers, making it a game changer for labs that require high-resolution analysis in a desktop format.

Electron microscopy has revolutionized the way we study materials and biological structures at the nano and atomic scales. Among the most powerful techniques, transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and cryo-transmission electron microscopy (cryo-TEM) each offer unique advantages for imaging and analysis. These advanced methods provide unparalleled resolution, elemental mapping, and in situ observations, making them essential in materials science, nanotechnology, and life sciences.
 

TEMs pass a focused electron beam through a thin sample, generating high-resolution images based on how electrons interact with the material’s thickness, density, and composition. Unlike SEM, which captures surface details, TEM provides internal structural information at the sub-nanometer to atomic scale, making it a key tool for materials characterization and biological research.
 

STEMs combine the transmission-based imaging of a TEM with SEM-style raster scanning, enabling high-resolution elemental and chemical analysis. By collecting additional signals such as characteristic X-rays and electron energy loss spectra (EELS), STEM provides precise elemental mapping, oxidation state analysis, and atomic-scale imaging. This makes it invaluable for nanotechnology, semiconductors, and materials science.
 

Cryo-TEMs have transformed structural and cell biology by revealing biomolecules and cellular environments in their native state at near-atomic resolution. Through single-particle analysis (SPA), cryo-electron tomography (cryo-ET), and micro-electron diffraction (microED), researchers can now explore molecular mechanisms and visualize biology in situ. With applications in drug discovery, virology, cell biology and protein structure determination, cryo-TEMs are driving breakthroughs in life sciences and medical research.

Focused ion beam scanning electron microscopy (FIB-SEM) is an advanced analytical technique that integrates the precise material modification capabilities of a focused ion beam with the high-resolution imaging of a scanning electron microscope. This combination allows scientists and engineers to perform highly localized characterization and analysis of a wide array of samples and materials at the nanoscale.
 

Thermo Fisher Scientific has been a pioneer in FIB-SEM technology for over three decades, developing DualBeam Technology that synergistically combines FIB and SEM functionalities. These instruments enable researchers to access subsurface structural details by making precise cuts with the FIB and subsequently imaging the exposed surfaces with the SEM. This capability has been widely adopted across various applications, facilitating detailed analysis and innovation. With over 2,000 Thermo Scientific systems installed globally, DualBeam Technology offers advanced capabilities built on continuous technical innovation and extensive application knowledge.
 

Advancing FIB-SEM technology further, Thermo Fisher Scientific introduced tri-beam systems that incorporate a femtosecond laser alongside the traditional FIB and SEM components. This addition allows for rapid material removal, enabling the creation of cross sections as large as hundreds of micrometers in under five minutes. The femtosecond laser's ablation mechanism effectively processes challenging materials, including non-conductive or ion-beam-sensitive samples, with minimal artifacts such as heat impact, microcracking or melting. Consequently, laser-milled surfaces are often clean enough for direct SEM imaging and surface-sensitive techniques like electron backscatter diffraction (EBSD) mapping, enhancing the efficiency and quality of nanoscale analysis. By integrating these advanced technologies, Thermo Scientific FIB-SEM instruments empower researchers and engineers to conduct precise, high-resolution analyses, driving innovation and discovery across various scientific and industrial domains.

Electrical failure analysis systems are essential tools for diagnosing and understanding the root causes of failures in electronic components and systems. These advanced instruments are widely used across industries, from semiconductor manufacturing to consumer electronics, to precisely investigate and resolve electrical failures. By providing detailed insights into material composition, surface characteristics, and structural integrity, these systems help engineers identify issues such as short circuits, overheating, and component degradation.

With state-of-the-art imaging and analytical capabilities, Thermo Scientific electrical failure analysis systems enable non-destructive testing, high-resolution imaging, and advanced material analysis to detect even the smallest defects or irregularities. These tools are designed to support failure analysis, quality control, and product development, providing invaluable data for improving reliability and performance. The ability to quickly pinpoint the source of electrical failures ensures that products meet industry standards, reduces downtime, and enhances design optimization for future electronics development.