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Scanning electron microscopes
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science, to forensics, to industrial manufacturing, and even to the life sciences.
As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology and industry.
Floor model SEMs offer the flexibility and versatility to meet a wide range of academic and industrial needs: support for large and heavy samples, a very wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.
Thermo Fisher Scientific is dedicated to producing analytical SEMs that are ideally suited for your specific needs. We offer a range of versatile tools, everything from our easy-to-use Thermo Scientific Phenom Desktop SEMs to powerhouse instruments capable of unparalleled resolution and contrast like the Thermo Scientific Verios SEM.
Floor-model scanning electron microscopes
| Product | Column technology | Stage | Low vacuum | |
|---|---|---|---|---|
| Axia ChemiSEM | SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis | Tetrode-boosted thermionic source | 120x120 mm² 5-axis motorized, eucentric | Optional |
| Prisma E SEM | Environmental SEM suited for a wide range of applications | Tetrode-boosted thermionic source | 110x110 mm2 5-axis motorized, eucentric | Standard |
| Quattro SEM | High resolution environmental SEM for in situ dynamic experiments | Field emission gun (FEG) | 110x110 mm2 5-axis motorized, eucentric | Standard |
| Apreo SEM | Versatile high-performance SEM | In-lens FEG | 110x110 mm2 5-axis motorized, eucentric | Optional |
| Verios SEM | The highest resolution, accuracy, and stability of all Thermo Scientific SEMs | Immersion UC FEG | 150x150 mm2 5-axis eucentric motorized, 2-axis piezo | N/A |
| VolumeScope 2 SEM | 3D SEM for large volume serial block face imaging | In-lens FEG | 110x110 mm2 5 axis motorized, eucentric | Standard |
High-resolutions scanning electron microscopes
If you would like to maximize resolution and contrast, look no further than our revolutionary Verios and Apreo SEMs. These instruments are committed to obtaining the most detailed information possible, with the excellent contrast and resolution of the Apreo SEM only matched by the world-leading performance of the Verios SEM.
Entry-level and environmental floor-model scanning electron microscopes
Our versatile Thermo Scientific Axia ChemiSEM, Thermo Scientific Prisma E and Thermo Scientific Quattro SEMs are the ideal choice if sample flexibility is a priority. The Axia ChemiSEM blends extreme sample size flexibility with the most intuitive and efficient EDS characterization workflow available. Available in traditional High Vacuum or as optional Low Vacuum configuration, the Axia ChemiSEM is the ideal platform for routine analysis and failure analysis.
The Thermo Scientific Prisma E and Quattro instruments are capable of remarkable all-around performance under a range of conditions due to the environmental SEM (ESEM) modes, enabling the analysis of charging, outgassing, wet, hot, dirty or otherwise difficult samples. High stability and ease of use (as well as a selection of optional accessories and a highly modular analytical chamber) make these instruments the tools of choice for multi-user labs. Both instruments feature the optional Thermo Scientific ChemiSEM Technology, which colorizes the greyscale SEM image in real time according to elemental composition using combined SEM and EDS imaging.
Desktop scanning electron microscopes
The Thermo Scientific Phenom product line redefines speed, ease-of-use and performance thanks to its innovative, user-friendly design and software, which allows even novice users to obtain an SEM image in minutes. Not only that, but the cutting-edge Phenom Pharos SEM even features a field emission gun (FEG) source, enabling resolutions below 3 nm.
Industrial Manufacturing Product Selector
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application:
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Electron microscopy learning center
Electron microscopy resources and reference materials for microscopy novices, experts, and everyone in between. The electron microscopy learning center provides a variety of informational and educational resources on electron microscopy for students, educators, or anyone that simply wants to learn more about this fascinating technology.
The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder specimen colorized with ChemiSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Self-catalyzed GaAs microwires imaged on Apreo. Sample courtesy of David Fuster at IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC).
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The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder specimen colorized with ChemiSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Self-catalyzed GaAs microwires imaged on Apreo. Sample courtesy of David Fuster at IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC).
Documents
Electron microscopy services
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Electron microscopy support and resources
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