Scanning electron microscopes (SEMs) generate images by scanning a sample with a focused beam of electrons. The interaction of the electrons with the sample material produces signals that contain information about surface topography and composition. With instruments capable of sub-nanometer resolution, high contrast, and compatibility with a wide variety of samples, the range of analysis that SEM can support has never been broader.

Thermo Fisher Scientific is dedicated to producing analytical SEMs that are ideally suited for your specific needs. We offer a range of versatile tools, everything from our easy-to-use Thermo Scientific Phenom Desktop SEMs to powerhouse instruments capable of unparalleled resolution and contrast like the Thermo Scientific Verios SEM.

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Life Sciences

 

Materials Science


Techniques

Life Sciences

 

Materials Science


Krios G4 Cryo-TEM for
Life Sciences

  • Improved ergonomics
  • Fits more easily into new and existing labs
  • Maximized productivity and automation
  • Best image quality for high-resolution 3D reconstruction

Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Glacios Cryo-TEM for
Life Sciences

  • Cryo-TEM
  • Small Footprint
  • Flexible Accelerating Voltage 80-200 kV
  • High Brightness X-FEG Electron Gun

Talos Arctica TEM for
Life Sciences

  • Increased data acquisition speed
  • High data with robotic sample handling & automated loading
  • Unattended platform operation and automated data acquisition
  • Low cost of ownership with remote diagnostics and preventive service

Themis ETEM

  • Precise control and knowledge of sample temperature
  • Improved sample stability, navigation, and assisted sample drift correction in x, y, and z axes
  • Advancing high-quality imaging and movie acquisition functions

Talos L120C TEM

  • Increased stability
  • 4k × 4K Ceta CMOS camera
  • TEM magnification range from 25 – 650 k×
  • Flexible EDS analysis reveals chemical information

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • Features Velox Software for fast and easy acquisition and analysis of multimodal data
  • High resolution and throughput in STEM imaging and chemical analysis
  • Add application-specific in situ sample holders for dynamic experiments

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios 5 Dualbeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities

Helios G4 PFIB DualBeam

  • High throughput large volume subsurface and 3D characterization
  • High-quality Ga+ free TEM samples
  • Extreme high resolution SEM imaging
  • Advanced ease of use and automation capabilities

Aquilos 2 Cryo-FIB for Life Sciences

  • Cryo-FIB
  • In-Situ Cryo-Lamellas Preparation
  • Fully Rotatable Cryo-Stage
  • Software for Image Correlation and Lamellas Preparation

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

Prisma E SEM

  • Entry-level SEM with excellent image quality
  • Easy and quick sample loading and navigation for multiple samples
  • Compatible with a wide range of materials thanks to dedicated vacuum modes

Quattro ESEM

  • Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM)
  • Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation

Apreo SEM

  • High-performance SEM for all-round nanometer or sub-nanometer resolution
  • In-column T1 backscatter detector for sensitive, TV-rate materials contrast
  • Excellent performance at long working distance (10 mm)

Verios XHR SEM

  • Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range
  • Easy access to beam landing energies as low as 20 eV
  • Excellent stability with piezo stage as standard

VolumeScope 2 SEM

  • Ability to reuse jobs and system settings 
  • Create multiple ROI
  • Ability to perform large 3D volume acquisition unattended
  • Reliable acquisition on charging samples with both HiVac and LoVac

Phenom Pharos Desktop SEM

  • The only desktop SEM with FEG source with 2 up to 15 kV acceleration voltage range
  • <2.5 nm (SE) and <4.0 nm (BSE) resolution @ 15 kV; up to 1,000,000x magnification
  • Optional fully integrated EDS and SE detector

Phenom XL G2 Desktop SEM

  • For large samples (100x100 mm) and ideal for automation
  • <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
  • Optional fully integrated EDS and BSE detector

Phenom ProX Desktop SEM

  • High performance desktop SEM with integrated EDS detector
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector

Phenom Pro Desktop SEM

  • High performance desktop SEM
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector

Phenom Pure Desktop SEM

  • Entry level desktop SEM
  • Resolution <25 nm; magnification up to 65,000x
  • Longlife CeB6 source

Phenom Perception GSR Desktop SEM

  • Dedicated automated GSR desktop SEM
  • Resolution <10 nm; magnification up to 200,000x
  • Longlife CeB6 source

Phenom ParticleX AM Desktop SEM

  • Versatile desktop SEM with automation software for Additive Manufacturing
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

HeliScan microCT

  • Advanced helical scanning and iterative reconstruction technology
  • High resolution x-ray source (below 400 nm)
  • Process, analyze, and visualize samples

Nexsa

  • Tilt Module for ARXPS measurements
  • Dual-mode ion source for expanded depth profiling capabilities
  • Insulator analysis

K-Alpha

  • Selectable area spectroscopy
  • Micro-focused monochromator
  • High-resolution chemical state spectroscopy

ESCALAB Xi+

  • High sensitivity spectroscopy
  • XPS with non-monochromatic X-rays
  • 180° hemispherical energy analyzer

Vitrobot for Life Sciences

  • Fully Automated Sample vitrification
  • Blotting Device
  • Semi-Automated Grid Transfer
  • High Sample Throughput

Auto Slice and View 4.0 Software

  • Serial sectioning for 3D STEM images
  • Imaging plus analytical data (EDS, EBSD)
  • On-the-fly editing capabilities
  • New algorithms – easier to use

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Amira Software for Life Sciences

  • Support for multi-data/view/channel
  • Interactive high-quality visualization
  • Machine Learning-based segmentation
  • Intuitive recipe creation

Pergeos Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Two-Phase Flow Simulation
  • Dual Energy Computed Tomography (DECT)

Tomography 4.0
Software

  • On-the-fly Reconstruction Algorithm
  • Fully Automatic TEM and STEM Acquisition
  • One-Time Calibration
  • Easy workflow from data to structure

EPU Software

  • Microscope-embedded solution for single particle acquisition
  • Optimized for high-throughput particle collection
  • Compatible with film, CCD cameras, and direct electron detectors

AutoTEM 5

  • Highest quality S/TEM sample preparation
  • Complete in situ S/TEM sample preparation workflow
  • Fully automated in-situ sample preparation

AutoScript 4

  • improved reproducibility and accuracy
  • Unattended, high throughput imaging and patterning
  • Supported by Python 3.5-based scripting environment

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up

Inspect 3D Software

  • Image processing tools and filters for cross-correlation
  • Feature tracking for image alignment
  • Algebraic reconstruction technique for iterative projection comparison

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process

Nanobuilder

  • CAD-based prototyping
  • FIB and GIS optimized
  • Automated alignment and drift control

ProSuite

  • Automated collection of images
  • Real-time remote control
  • Standard applications included: Automated Image Mapping + Remote User Interface

PoroMetric

  • Correlate pore features such as area, aspect ratio, major and minor axis
  • Acquire images directly from the Desktop SEM
  • Statistical data with high-quality images

ParticleMetric

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with Automated Image Mapping

Elemental Mapping

  • Fast and reliable information on the distribution of elements within the sample or the selected line
  • Easily exported and reported results

3D Reconstruction

  • Intuitive user interface, maximum employability
  • Intuitive fully automated user interface
  • Based on 'shape from shading' technology, no stage tilt required

FiberMetric

  • Save time by automated measurements
  • Fast and automated collection of all statistical data
  • View and measure micro and nano fibers with unmatched accuracy

Phenom Programming Interface

  • Customize your SEM to fit your workflow
  • Increase efficiency and save time with automated processes
  • Control imaging settings and stage navigation

AsbestoMetric

  • Automated tool for image acquisition, fiber detection and reporting
  • Assisted EDX analysis with fiber revisiting
  • ISO standard report on asbestos analysis

Quartz PCI/CFR

  • SEM imaging traceability compliant with 21 CFR Part 11
  • Compatible with the Phenom XL and Phenom Pro desktop SEMs
  • Windows 10 64-bit operating system support

μHeater

  • Ultra-fast heating solution for in situ high resolution imaging
  • Fully integrated
  • Temperatures up to 1200 °C

μPolisher

  • Potential to enable large number of novel, unexplored applications
  • Very low energy milling
  • Small spot size for precise local surface treatment

Falcon 4 Detector

  • Leading detective quantum efficiency
  • 10x shorter exposure time than its predecessor
  • Fully embedded in Thermo Scientific software
  • Built in data management

Ceta D Camera

  • Optimum performance at any high tension (20–300 kV)
  • Compatible with post-column filters and spectrometers
  • Movie acquisition for dynamic studies

Quick comparison of floor-model SEMs

Product   Column technology Stage Low vacuum
Prisma E SEM Environmental SEM suited for a wide range of applications Tetrode-boosted thermionic source 110x110 mm2 5-axis motorized, eucentric Standard
Quattro SEM High resolution environmental SEM for in situ dynamic experiments Field emission gun (FEG) 110x110 mm2 5-axis motorized, eucentric Standard
Apreo SEM Versatile high-performance SEM In-lens FEG 110x110 mm2 5-axis motorized, eucentric Optional
Verios SEM The highest resolution, accuracy, and stability of all Thermo Scientific SEMs Immersion UC FEG 150x150 mm2 5-axis eucentric motorized, 2-axis piezo N/A
VolumeScope 2 SEM 3D SEM for large volume serial block face imaging In-lens FEG 110x110 mm2 5 axis motorized, eucentric Standard
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Desktop SEMs

The Thermo Scientific Phenom product line redefines speed, ease-of-use and performance thanks to its innovative, user-friendly design and software, which allows even novice users to obtain an SEM image in minutes. Not only that, but the cutting-edge Phenom Pharos SEM even features a field emission gun (FEG) source, enabling resolutions below 3 nm.

Entry-level and environmental floor-model SEMs

Our versatile Thermo Scientific Prisma E and Thermo Scientific Quattro SEMs are the ideal choice if sample flexibility is a priority. These instruments are capable of remarkable all-around performance under a range of conditions due to their low vacuum modes, enabling the analysis of charging, outgassing or otherwise difficult samples. High stability and ease of use (as well as a selection of optional accessories and a highly modular analytical chamber) make these instruments the tools of choice for multi-user labs.

Both instruments feature the optional Thermo Scientific ColorSEM Technology, which colorizes the greyscale SEM image in real time according to elemental composition using combined SEM and EDS imaging.

High-resolutions systems

If you would like to maximize resolution and contrast, look no further than our revolutionary Verios and Apreo SEMs. These instruments are committed to obtaining the most detailed information possible, with the excellent contrast and resolution of the Apreo SEM only matched by the world-leading performance of the Verios SEM.

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Electron Microscopy

Scanning Electron Microscopy

SEM solutions for a wide range of surface analysis needs.

Glass sample imaged with low vacuum SEM.
The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
CaCu₃Ti₄O₁₂ (CCTO) sample imaged with SEM.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder sample imaged with SEM and colorized with ColorSEM Technology.
Corroded solder specimen colorized with ColorSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
Mesoporous silicon dioxide SiO₂ imaged with SEM.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Metallic filter mesh sample imaged with Desktop SEM.
Metallic filter mesh sample showing the enhanced high-resolution imaging capabilities of the Phenom Pharos Desktop SEM.
Glass sample imaged with low vacuum SEM.
The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
CaCu₃Ti₄O₁₂ (CCTO) sample imaged with SEM.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder sample imaged with SEM and colorized with ColorSEM Technology.
Corroded solder specimen colorized with ColorSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
Mesoporous silicon dioxide SiO₂ imaged with SEM.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Metallic filter mesh sample imaged with Desktop SEM.
Metallic filter mesh sample showing the enhanced high-resolution imaging capabilities of the Phenom Pharos Desktop SEM.
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