The Thermo Scientific iFast Developer's Tool Kit combines the flexibility of scripting with the ease of use of graphical programming to make recipe creation faster and easier than ever before. 

The iFast Developer's Tool Kit enables operators to quickly and easily create new or modify existing recipes to fit their specific needs. Recipes are edited within a new intuitive graphical environment, enabling faster learning of the programming environment as well as an easier understanding of existing recipes. Within the iFast Developer's environment, the operator is able to control column settings, detector settings, stage motion and position, patterning and site alignments with logical operation and looping. This enables a high degree of customization to match specific application requirements. 

iFast Recorder is included with iFast Developer's Tool Kit allowing to record recipes interactively on an instrument both for unattended operation as well as the creation of a baseline recipe for further enhancements with the Developer's Tool Kit.

Key Features

  • Graphical programming environment.
  • Runner for unattended operation.
  • Alignment tools: image recognition and edge finding.
  • FIB, SEM, Stage, GIS, patterning and other controls.
  • Macro recorder for faster recipe creating.
  • Process looping.
  • Logical tests such as If-Then statements.

Applications

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Semiconductor Pathfinding and Development

Advanced electron microscopy, focused ion beam, and associated analytical techniques for identifying viable solutions and design methods for the fabrication of high-performance semiconductor devices.

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Yield Ramp and Metrology

We offer advanced analytical capabilities for defect analysis, metrology, and process control, designed to help increase productivity and improve yield across a range of semiconductor applications and devices.

Semiconductor Failure Analysis

Semiconductor Failure Analysis

Increasingly complex semiconductor device structures result in more places for failure-inducing defects to hide. Our next-generation workflows help you localize and characterize subtle electrical issues that affect yield, performance, and reliability.

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Physical and Chemical Characterization

Ongoing consumer demand drives the creation of smaller, faster, and cheaper electronic devices. Their production relies on high-productivity instruments and workflows that image, analyze, and characterize a broad range of semiconductor and display devices.

Semiconductor Analysis and Imaging

Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.

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Semiconductor Analysis and Imaging

Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.

Learn more ›


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Electron microscopy services

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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