The Thermo Scientific Helios Hydra DualBeam (focused ion beam scanning electron microscope, FIB-SEM) delivers four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as STEM and TEM sample preparation and 3D materials characterization.
Switching between argon, nitrogen, oxygen and xenon is easy and can be done in under ten minutes without sacrificing performance. This unprecedented flexibility significantly expands the potential application space of FIB and enables research of ion-sample interactions to optimize existing use cases.
The Thermo Scientific Helios Hydra DualBeam combines the new, innovative multi-ion-species plasma FIB (PFIB) column with the monochromated Thermo Scientific Elstar SEM Column to provide advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation and analysis of relevant subsurface volumes.
Broad application space
Unique ion source delivers four quickly switchable ion species: xenon, argon, oxygen, or nitrogen.
High throughput and quality
High-throughput, high-quality, and statistically relevant 3D characterization, cross sectioning and micromachining using the next-generation 2.5 μA plasma FIB column.
Multi-modal subsurface and 3D information
Access to high-quality, multi-modal subsurface and 3D information with precise targeting of the region of interest using optional Thermo Scientific Auto Slice & View 4 (AS&V4) Software.
High-quality sample preparation
High-quality gallium-free TEM sample preparation with xenon or argon thanks to the guided TEM sample preparation workflow and the PFIB's superior performance (at all operating conditions).
Sub-nanometer performance
Finest details using the best-in-class Elstar Electron Column with high-current UC+ monochromator technology, enabling sub-nanometer performance at low energies.
Complete sample information
Sharp, refined and charge-free contrast obtained from up to six integrated in-column and below-the-lens detectors.
Electron and ion beam-induced deposition and etching
Most advanced capabilities for electron and ion beam-induced deposition and etching on DualBeam systems with optional MultiChem or GIS Gas Delivery Systems.
Precise sample navigation
Tailored to individual application needs thanks to the high-flexibility 110-mm stage and optional in-chamber Thermo Scientific Nav-Cam Camera.
Artifact-free imaging
Based on integrated sample cleanliness management and dedicated imaging modes such as SmartScan and DCFI.
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| Stage and sample | Flexible, five-axis motorized stage:
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High-precision, five-axis motorized stage with Piezo-driven XYR axis
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| Electron beam parameter space |
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| Ion optics | High-performance PFIB column with unique inductively coupled plasma (ICP) source supporting four ion species with fast switching capability
Xe Ion beam resolution at coincident point
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3D reconstruction of an automotive oil filter casing, acquired with the Helios Hydra DualBeam and Auto Slice & View 4 Software for automated serial sectioning. Horizontal field width = 350 µm.
Introducing the Helios Hydra DualBeam
Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples? Are you trying to uncover the highest quality subsurface information from the most challenging samples?
Register below to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.
3D reconstruction of an automotive oil filter casing, acquired with the Helios Hydra DualBeam and Auto Slice & View 4 Software for automated serial sectioning. Horizontal field width = 350 µm.
Introducing the Helios Hydra DualBeam
Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples? Are you trying to uncover the highest quality subsurface information from the most challenging samples?
Register below to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.
Process Control
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality Control
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
3D Materials Characterization
Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.
S/TEM Sample Preparation
DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for S/TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.
APT Sample Preparation
Atom probe tomography (APT) provides atomic-resolution 3D compositional analysis of materials. Focused ion beam (FIB) microscopy is an essential technique for high-quality, orientation, and site-specific sample preparation for APT characterization.
Cross-sectioning
Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.
In Situ experimentation
Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
3D Materials Characterization
Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.
S/TEM Sample Preparation
DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for S/TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.
APT Sample Preparation
Atom probe tomography (APT) provides atomic-resolution 3D compositional analysis of materials. Focused ion beam (FIB) microscopy is an essential technique for high-quality, orientation, and site-specific sample preparation for APT characterization.
Cross-sectioning
Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.
In Situ experimentation
Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
Electron microscopy services for
the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
