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Helios Hydra PFIB-SEM instruments overview
Thermo Scientific Helios Hydra PFIB-SEMs (plasma focused ion beam scanning electron microscopes) are unique, multi-ion-species plasma-FIB platforms that excel across applications, materials, and length scales due to the ability to match materials of interest to the ion species required.
Helios Hydra 5+ PFIB-SEM
The Thermo Scientific Helios Hydra 5+ PFIB-SEM provides a new generation of plasma-FIB applications technology, with increased ion beam performance for large-volume material removal at remarkable speed, quality, and automation performance for TEM lamella preparation. Experience stability and damage-free delayering capabilities for extended-run automation and acquisition.
With high-performance packages, like Extreme Milling and Damage-Free Delayering, you can supercharge your Helios and Helios Hydra PFIB-SEMs with customizable, application-based automation, robustness, and throughput enhancements.
Helios Hydra 5+ PFIB-SEM features
The Helios Hydra 5+ PFIB-SEM features ultra-boosted FIB performance for up to 2-4x times higher cross-section throughput compared to traditional plasma-FIB, with increased max currents for Xe+ and Ar+ and incredible verticality for high-aspect-ratio features. It offers optimized SEM stability with 100 eV imaging for delayering applications and fully automated beam alignments at <500 eV. Applications automation provides robustness for lamella preparation (top-down, planar, and inverted configurations) and helps ensure reliable results over marathon delayering processes. Additionally, system uptime is improved with fully automated PFIB alignments for all apertures and an enhanced vacuum system designed for bulk material removal.
Helios Hydra 5 PFIB-SEM
The Thermo Scientific Helios 5 Hydra PFIB-SEM is a versatile, multi-application instrument that has four different ion species (argon, nitrogen, oxygen, and xenon), allowing you to choose the ions that provide the best results for samples that include metals, batteries, and semiconductors.
Great results start with sample preparation, whether you are performing scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation, 3D characterization, and large-area failure analysis.
You can switch easily between argon, nitrogen, oxygen, and xenon in under ten minutes without sacrificing performance. This remarkable flexibility significantly expands the potential application space of PFIB and enables research of ion–sample interactions to optimize existing use cases.
Helios Hydra 5 PFIB-SEM features
The Helios Hydra 5 PFIB-SEM allows fast switching between four ion species (Xe, Ar, O, and N) to optimize every samples. It facilitates fast and easy preparation of high-quality samples, including gallium-free TEM lamellae. The system performs high-resolution, large-volume 3D tomography and combines multi-modal subsurface 3D information (SEM, EDS, EBSD). It delivers precise control of milling experiments with time-saving automated software and workflow-based solutions. For an instrument dedicated to life science applications, please explore the Thermo Scientific Hydra Bio Plasma-FIB.
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Helios Hydra 5 PFIB-SEM |
Helios Hydra 5+ PFIB-SEM |
| Maximum ion beam current | |
| 2.5uA Xe, 4uA Ar | 3.75uA Xe, 6uA Ar |
| Minimum electron beam voltage | |
| 350 eV | 100 eV |
| Full beam alignment automation | |
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For Research Use Only. Not for use in diagnostic procedures.