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Quattro Environmental Scanning Electron Microscope

The Thermo Scientific Quattro ESEM combines all-around performance in imaging and analytics with a unique environmental mode (ESEM) that allows samples to be studied in their natural state. It is ideal for a wide variety of academic, industrial, and government labs that want the versatility and ease of use needed for multiple users of different experience levels and disciplines on a platform that also supports unique in situ experiments. The Quattro ESEM features a field emission gun (FEG), which ensures excellent resolution. Meanwhile, its three vacuum modes (high vacuum, low vacuum, and ESEM) provide the flexibility to accommodate the widest range of samples of any SEM available, including those that are outgassing or otherwise not vacuum-compatible.

Best in class for in situ imaging capabilities, dynamic experiments with excellent analytical capabilities

The Quattro ESEM is a highly flexible platform for in situ dynamic experiments. The Quattro ESEM's environmental SEM capability allows scientists to study materials in a range of conditions, such as wet/humid, hot, or reactive environments, as they develop new materials and products. It supports cooling and heating experiments both in high vacuum and low vacuum to accommodate the widest range of needs. Cooling experiments on wet materials are possible with the Peltier cooling stage or if the transmission mode is needed, with Thermo Scientific WetSTEM Technology. Additionally, the Quattro ESEM provides several different possibilities to heat the samples of interest, both bulk and powders. Users can perform dynamic experiments at high temperatures both in high vacuum (with the high-vacuum heating stage), in low-vacuum/ESEM mode (with the two ESEM heating stages for temperatures up to 1,000°C and 1,400°C), and on a localized area for better control of the temperature change (with the Thermo Scientific µHeater Holder).

Thanks to the Quattro ESEM chamber size, it accommodates a wide range of accessories. Analytical capabilities include energy dispersive X-ray spectroscopy (EDS) with ports for 180-degree dual EDS attachment, electron backscatter diffraction (EBSD) coplanar with EDS, and wavelength dispersive X-ray spectroscopy (WDS). Furthermore, the Quattro ESEM comes with the new Thermo Scientific ChemiSEM Technology, a unique live elemental imaging capability that is fully integrated into the SEM user interface, providing always-available compositional information through the most intuitive interface.


Diverse material application observed with the Quattro ESEM

Quattro Environmental Scanning Electron Microscope features

Dynamic in situ experiments

In situ study of materials in their natural state: unique high-resolution FEG-SEM with environmental mode (ESEM). In situ analysis at temperatures ranging from -165°C to 1,400°C with a range of cryo, Peltier, and heating stages.

Peltier cooling experiment of sodium sulfate crystals in sandstone

In situ cooling experiment conducted on a sandstone sample with crystals of sodium sulfate. The target of the experiment was to study the sodium sulfate  behavior when completely hydrated. The pressure was varied up to 700 Pa, maintaining the temperature at 2˚C. Sample courtesy of Institute of Theoretical and Applied Mechanics of the Academy of Science, Czech Republic.

μHeater Holder heating experiment of magnetite and hematite

Heating experiment run with the μHeater Holder. The video shows the heating of a mix of magnetite and hematite from 40˚C up to 1,000˚C.

Wide range of information

Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation. Several additional detectors, such as the STEM3+ detector and the retractable RGB cathodoluminescence (CL) detector are available to accommodate every user’s need and provide a complete set of information from a wide range of materials.

Excellent analytical capabilities

Excellent analytical capabilities with a flexible chamber that allows multiple EDS, EBSD, or WDS detectors. Elemental information at your fingertips with ChemiSEM Technology, which provides live, quantitative, elemental mapping for unprecedented time to result and ease of use. Excellent analysis of non-conductive samples: accurate EDS and EBSD are enabled in low vacuum with the Quattro ESEM's through-the-lens pumping.

Minimize sample preparation time with the unique combination of high-vacuum, low-vacuum, and environmental modes

Ease of use with innovative options and advanced automation

Easy to use, intuitive software with User Guidance. The unique Undo function permits efficient exploration of imaging conditions and allows you to work faster with fewer mouse clicks.

Optimize your work and feel free to explore the imaging condition with the unique Undo function.

Advanced automation

Advanced automation is provided in different ways, with either Thermo Scientific AutoScript 4 Software or Thermo Scientific Maps Software, depending on the specific application needs.

AutoScript 4 Software offers control of the Quattro ESEM. Take advantage of a Python-based application programming interface (API) to optimize your in situ cooling or heating experiments or record and monitor dynamic parameters such as temperature, stage position, or pressure.

Maps Software automates large-area acquisition on multiple samples with up to four different simultaneous signals. In addition to a clear increase in the system productivity, it offers a multi-scale, multi-layered visualization environment in which 2D and 3D data and imagery can be imported from any source to correlate different modalities.

Live drift compensation with AutoScript 4 Software on an ESEM heating stage experiment

ESEM heating stage experiment on a silver wire, heated from 300˚C to 530˚C. AutoScript 4 Software was used to obtain a live drift compensation through a combination of beam shift and stage moves. The result was a stable image of the silver wire for the whole duration of the movie, even when the wire changed location over the substrate.


Specifications

Style Sheet for Products Table Specifications
Resolution
  • High-vacuum imaging
    • 0.8 nm at 30 kV (STEM)
    • 1.0 nm at 30 kV (SE) in high vacuum
    • 1.3 nm at 30 kV (SE) in low vacuum and ESEM mode
    • 3.0 nm at 1 kV (SE)
Standard detectors
  • ETD, low-vacuum SED (LVD), gaseous SED for ESEM mode (GSED), IR camera
Optional detectors
  • Nav-Cam+, DBS, DBS-GAD, ESEM-GAD, ICD, STEM 3+, WetSTEM, RGB-CLD, EDS, EBSD, WDS, Raman, EBIC, etc.
ChemiSEM Technology (optional)
  • Live quantitative SEM image coloring is available based on energy-dispersive X-ray spectroscopy (EDS). Point & ID, linescan, region, element maps and accurate Noran quantification are included.
Stage bias (beam deceleration, optional)
  • -4000 V to +50 V
Low vacuum mode
  • Up to 2600 Pa (H2O) or 4000 Pa (N2)
Stage
  • 5-axis motorized eucentric stage, 110 x 110 mm2 with a 105° tilt range. Maximum sample weight: 5 kg in un-tilted position.
Standard sample holder
  • Standard multi-sample SEM holder uniquely mounts directly onto the stage, hosts up to 18 standard stubs (⌀ 12 mm), does not require tools to mount a sample
Chamber
  • 340 mm inside width, 12 ports, three simultaneous EDS detectors possible, two at 180°, coplanar EDS/EBSD orthogonal to the tilt axis of the stage
In situ accessories (optional)
  • Software controlled -20° C to +60° C Peltier cold stage
  • Software controlled 1000° C low vacuum/ESEM heating stage
  • Software controlled 1100° C high vacuum heating stage
  • Software controlled 1400° C low vacuum/ESEM heating stage
  • Integrated gas injection: up to 2 units (other accessories may limit number of GIS available) for beam-induced deposition of the following materials:
    • Platinum
    • Tungsten
    • Carbon
  • Manipulators
  • Cryo-stage
  • Electrical probing / multi-probing stations
Software options
  • Maps Software for automatic large area acquisition using tiling and stitching; correlative work
  • AutoScript 4 Software; a Python-based application programming interface
  • Pattern generation software
  • Thermo Scientific TopoMaps Software for image colorization, image analysis and 3D surface reconstruction
Style Sheet for Komodo Tabs

Resources

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Applications

Process control using electron microscopy

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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Semiconductor Pathfinding and Development

Advanced electron microscopy, focused ion beam, and associated analytical techniques for identifying viable solutions and design methods for the fabrication of high-performance semiconductor devices.

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Yield Ramp and Metrology

We offer advanced analytical capabilities for defect analysis, metrology, and process control, designed to help increase productivity and improve yield across a range of semiconductor applications and devices.

Semiconductor Failure Analysis

Semiconductor Failure Analysis

Increasingly complex semiconductor device structures result in more places for failure-inducing defects to hide. Our next-generation workflows help you localize and characterize subtle electrical issues that affect yield, performance, and reliability.

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Physical and Chemical Characterization

Ongoing consumer demand drives the creation of smaller, faster, and cheaper electronic devices. Their production relies on high-productivity instruments and workflows that image, analyze, and characterize a broad range of semiconductor and display devices.


Techniques

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Environmental SEM (ESEM)

Environmental SEM allows materials to be imaged in their native state. This is ideally suited for academic and industrial researchers who need to test and analyze samples that are wet, dirty, reactive, outgassing or otherwise not vacuum compatible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Cathodoluminescence

Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.

Learn more ›

EDS Analysis with ChemiSEM Technology

Energy dispersive X-ray spectroscopy for materials characterization.

Learn more ›

Semiconductor Analysis and Imaging

Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Environmental SEM (ESEM)

Environmental SEM allows materials to be imaged in their native state. This is ideally suited for academic and industrial researchers who need to test and analyze samples that are wet, dirty, reactive, outgassing or otherwise not vacuum compatible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Cathodoluminescence

Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.

Learn more ›

EDS Analysis with ChemiSEM Technology

Energy dispersive X-ray spectroscopy for materials characterization.

Learn more ›

Semiconductor Analysis and Imaging

Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.

Learn more ›

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Contact us

Electron microscopy services

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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