Advanced materials characterization labs require access to the latest techniques and will push analytical tools, including SEMs, to the extremes of their capabilities. Most of these labs are multi-user facilities that accommodate users with varying degrees of experience. Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided.

The new Thermo Scientific Apreo 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise. With Thermo Scientific ColorSEM Technology, a unique live elemental imaging capability, compositional information is always available, through the most intuitive interface. Eliminating all the hassle associated with typical EDS implementations, ColorSEM Technology offers unprecedented time to result and ease of use.

The Apreo 2 SEM poses much smaller demands on users and lab managers with Thermo Scientific SmartAlign Technology, an optics system that aligns itself. Furthermore, the Apreo 2 SEM automates the image fine-tuning process with Thermo Scientific FLASH technology. FLASH Technology executes any necessary corrections to lens centering, the stigmators, and final focus of the image. The combination of these technologies means that users new to electron microscopy can access the high-end performance of the Apreo 2 SEM. Additionally, the Apreo 2 SEM is the only SEM with a 1-nanometer resolution at 10 mm analytical working distance. No longer does long working distance mean poor imaging. With the Apreo 2 SEM, anyone will be able to confidently get great results.

Apreo 2 SEM video teaser

Key Features

All-round resolution

All-around nanometer or sub-nanometer resolution performance on materials ranging from nanoparticles, powders, catalysts, and nanodevices to bulk magnetic samples.

Wide range of sample types

Extreme flexibility for handling a wide range of sample types, including insulators, sensitive materials, or magnetic samples, and for collecting the data that matters most to your application.

SmartAlign Technology

Less time spent on maintenance with SmartAlign Technology, an optics system that aligns itself.

Live quantitative EDS

Elemental information at your fingertips with ColorSEM Technology, which provides live quantitative elemental mapping for unprecedented time to result and ease of use.

Advanced automation

Advanced automation including FLASH for automatic image finetuning, Undo, User Guidance, Maps tiling and stitching

Long working distance

The only SEM with high-resolution performance (1 nm) and excellent image quality at analytical working distance (10 mm), offering worry-free operation, even for novice users.


Specifications

Style Sheet for Products Table Specifications
 

Apreo 2 S

Apreo 2 C

Resolution

  • 0.9 nm at 1 kV
  • 0.8 nm at 1 kV (beam decel.)
  • 1.0 nm at 1 kV, 10 mm working distance (beam decel.)
  • 0.8 nm at 500 V (beam decel.)
  • 1.2 nm at 200 V (beam decel.)
  • 1.2 nm at 1 kV
  • 1.0 nm at 1 kV (beam decel.)
  • 1.2 nm at 500 V (beam decel.)

Standard detectors

  • ETD, T1, T2, T3, IR-CCD, Nav-Cam+
  • ETD, T1, T2, IR-CCD, Nav-Cam+
PivotBeam
  • Mode for selected area electron channeling (also known as "rocking beam" mode).
  • Not applicable

Optional detectors

  • DBS, LVD, DBS-GAD, STEM 3+, RGB-CLD, EDS, EBSD, WDS, Raman, EBIC, etc.

ColorSEM Technology (optional)

  • Live quantitative SEM image coloring is available based on energy dispersive X-ray spectroscopy (EDS). Point & ID, linescan, region, element maps, and reliable Noran quantification are included.

Landing energy range

  • 20 eV – 30 keV

Stage bias (beam deceleration)

  • -4000 V to +600 V standard with every system

Low vacuum mode

  • Optional: 10 – 500 Pa chamber pressure

Stage

  • 5-axis motorized eucentric stage, 110 x 110 mm2 with a 105° tilt range. Maximum sample weight: 5 kg in un-tilted position.

Maximum beam current

  • 50 nA (400 nA configuration also available)

Standard sample holder

  • Multi-purpose holder, uniquely mounts directly onto the stage, hosts up to 18 standard stubs (Ø12 mm), three pre-tilted stubs, cross-section samples and two pre-tilted row-bar holders (38° and 90°) and does not require tools to mount a sample

Chamber

  • 340 mm inside width, 12 ports, three simultaneous EDS detectors possible, two at 180°, coplanar EDS/EBSD orthogonal to the tilt axis of the stage
Style Sheet for Techniques (LONG VERSION) and Media Gallery Tab

On-demand webinar: Introduction to Apreo 2 - Unmatched versatility powered by ColorSEM Technology

This is an introduction on-demand webinar to be followed by a more extensive overview of the Apreo 2 SEM, its features, functionalities, ColorSEM technology, and a demonstration of the Apreo 2 in action. Attend this on-demand webinar to:

  • Learn about the latest in analytical UHR-SEM from Thermo Fisher Scientific.
  • Get introduced to the Apreo 2 SEM.

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

This video demonstrates how Apreo's Trinity detection system quickly answers all our questions about a sample. 

Highlight contrast that would otherwise go unnoticed

On-demand webinar: Introduction to Apreo 2 - Unmatched versatility powered by ColorSEM Technology

This is an introduction on-demand webinar to be followed by a more extensive overview of the Apreo 2 SEM, its features, functionalities, ColorSEM technology, and a demonstration of the Apreo 2 in action. Attend this on-demand webinar to:

  • Learn about the latest in analytical UHR-SEM from Thermo Fisher Scientific.
  • Get introduced to the Apreo 2 SEM.

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

This video demonstrates how Apreo's Trinity detection system quickly answers all our questions about a sample. 

Highlight contrast that would otherwise go unnoticed

Applications

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Cathodoluminescence

Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

Cathodoluminescence

Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›


Contact us

Electron microscopy services

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

Learn more ›

Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards