Advanced materials characterization labs require access to the latest techniques and will push analytical tools, including SEMs, to the extremes of their capabilities. Most of these labs are multi-user facilities that accommodate users with varying degrees of experience. Time on the microscope is precious, and excessive time spent on maintenance, alignments, training, or image optimization needs to be avoided.
The new Thermo Scientific Apreo 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise. With Thermo Scientific ColorSEM Technology, a unique live elemental imaging capability, compositional information is always available, through the most intuitive interface. Eliminating all the hassle associated with typical EDS implementations, ColorSEM Technology offers unprecedented time to result and ease of use.
The Apreo 2 SEM poses much smaller demands on users and lab managers with Thermo Scientific SmartAlign Technology, an optics system that aligns itself. Furthermore, the Apreo 2 SEM automates the image fine-tuning process with Thermo Scientific FLASH technology. FLASH Technology executes any necessary corrections to lens centering, the stigmators, and final focus of the image. The combination of these technologies means that users new to electron microscopy can access the high-end performance of the Apreo 2 SEM. Additionally, the Apreo 2 SEM is the only SEM with a 1-nanometer resolution at 10 mm analytical working distance. No longer does long working distance mean poor imaging. With the Apreo 2 SEM, anyone will be able to confidently get great results.
Apreo 2 SEM video teaser
All-round resolution
All-around nanometer or sub-nanometer resolution performance on materials ranging from nanoparticles, powders, catalysts, and nanodevices to bulk magnetic samples.
Wide range of sample types
Extreme flexibility for handling a wide range of sample types, including insulators, sensitive materials, or magnetic samples, and for collecting the data that matters most to your application.
SmartAlign Technology
Less time spent on maintenance with SmartAlign Technology, an optics system that aligns itself.
Live quantitative EDS
Elemental information at your fingertips with ColorSEM Technology, which provides live quantitative elemental mapping for unprecedented time to result and ease of use.
Advanced automation
Advanced automation including FLASH for automatic image finetuning, Undo, User Guidance, Maps tiling and stitching
Long working distance
The only SEM with high-resolution performance (1 nm) and excellent image quality at analytical working distance (10 mm), offering worry-free operation, even for novice users.
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Apreo 2 C |
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Standard detectors |
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Optional detectors |
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ColorSEM Technology (optional) |
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Landing energy range |
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Stage bias (beam deceleration) |
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Low vacuum mode |
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Maximum beam current |
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Standard sample holder |
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On-demand webinar: Advanced Apreo 2 SEM: unmatched versatility powered by ColorSEM Technology
Learn how you can more quickly and easily meet your need for high-quality imaging and analysis of a range of samples at this webinar.
On-demand webinar: Introduction to Apreo 2 - Unmatched versatility powered by ColorSEM Technology
This is an introduction on-demand webinar to be followed by a more extensive overview of the Apreo 2 SEM, its features, functionalities, ColorSEM technology, and a demonstration of the Apreo 2 in action. Attend this on-demand webinar to:
- Learn about the latest in analytical UHR-SEM from Thermo Fisher Scientific.
- Get introduced to the Apreo 2 SEM.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
This video demonstrates how Apreo's Trinity detection system quickly answers all our questions about a sample.
Highlight contrast that would otherwise go unnoticed
On-demand webinar: Advanced Apreo 2 SEM: unmatched versatility powered by ColorSEM Technology
Learn how you can more quickly and easily meet your need for high-quality imaging and analysis of a range of samples at this webinar.
On-demand webinar: Introduction to Apreo 2 - Unmatched versatility powered by ColorSEM Technology
This is an introduction on-demand webinar to be followed by a more extensive overview of the Apreo 2 SEM, its features, functionalities, ColorSEM technology, and a demonstration of the Apreo 2 in action. Attend this on-demand webinar to:
- Learn about the latest in analytical UHR-SEM from Thermo Fisher Scientific.
- Get introduced to the Apreo 2 SEM.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
This video demonstrates how Apreo's Trinity detection system quickly answers all our questions about a sample.
Highlight contrast that would otherwise go unnoticed
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Quality Control
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Semiconductor Pathfinding and Development
Advanced electron microscopy, focused ion beam, and associated analytical techniques for identifying viable solutions and design methods for the fabrication of high-performance semiconductor devices.
Yield Ramp and Metrology
We offer advanced analytical capabilities for defect analysis, metrology, and process control, designed to help increase productivity and improve yield across a range of semiconductor applications and devices.
Semiconductor Failure Analysis
Increasingly complex semiconductor device structures result in more places for failure-inducing defects to hide. Our next-generation workflows help you localize and characterize subtle electrical issues that affect yield, performance, and reliability.
Physical and Chemical Characterization
Ongoing consumer demand drives the creation of smaller, faster, and cheaper electronic devices. Their production relies on high-productivity instruments and workflows that image, analyze, and characterize a broad range of semiconductor and display devices.
ColorSEM
Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.
Energy Dispersive Spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
Imaging Hot Samples
Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.
Cathodoluminescence
Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
Semiconductor Analysis and Imaging
Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.
ColorSEM
Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.
Energy Dispersive Spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
Imaging Hot Samples
Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.
Cathodoluminescence
Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
Semiconductor Analysis and Imaging
Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.
Electron microscopy services
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
