The Thermo Scientific Apreo Scanning Electron Microscope (SEM) features a revolutionary compound lens design combined with electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.
The Apreo SEM benefits from unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The optional low-vacuum mode now has a 500 Pa maximum chamber pressure for imaging even the most demanding insulators.
With all these advantages, including the compound final lens, advanced detection and flexible sample handling, the performance and versatility of the Apreo SEM can meet your research challenges for many years to come.
All-round resolution
All-around performance at nanometer or sub-nanometer resolution on materials ranging from nanoparticles, powders, catalysts and nanodevices to bulk magnetic samples.
Backscatter detection
Backscattered electron (BSE) detection for materials contrast is always available, even at low voltage and beam currents, at any tilt angle, on beam sensitive samples and at TV-rate imaging.
Supports multiple detectors
A superior analytics platform provided by high beam currents and a small spot size. The chamber supports three energy-dispersive X-ray spectroscopy (EDS) detectors, coplanar EDS & electron backscatter diffraction (EBSD), and low vacuum optimized for analytics.
Easy sample handling
Easy sample handling and navigation with the multi-purpose sample holder and Thermo Scientific Nav-Cam+ Camera.
Unparalleled detector flexibility
Obtain the contrast or signal intensity that matters most by combining information from individual detector segments.
Low-vacuum mode
The widest range of charge mitigation strategies, including a low-vacuum mode with a chamber pressure of up to 500 Pa to enable imaging and analytics of any sample.
Advanced user guidance
Expert results for new users through advanced user guidance, presets and undo functionality.
Apreo S |
Apreo C |
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Standard detectors |
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Optional detectors |
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Landing energy range |
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Stage bias (beam deceleration) |
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Low vacuum mode |
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Maximum beam current |
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Standard sample holder |
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Chamber |
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Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Quality Control
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
ColorSEM
Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.
Energy Dispersive Spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
Imaging Hot Samples
Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.
Cathodoluminescence
Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
ColorSEM
Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.
Energy Dispersive Spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
Imaging Hot Samples
Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.
Cathodoluminescence
Cathodoluminescence (CL) describes the emission of light from a material when it is excited by an electron beam. This signal, captured by a specialized CL detector, carries information on the sample’s composition, crystal defects, or photonic properties.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
Electron microscopy services
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
