IC designers and QA program managers in manufacturing and test house facilities worldwide have embraced the Thermo Scientific MK.4, a versatile, powerful, and flexible, high yield test system. Easily upgradeable, the MK.4 is fully capable of taking your test operations through ever evolving regulatory and quality standards. The advanced rapid relay-based (modular matrix) hardware of the MK.4 is on average ten times faster than mechanically driven ESD testers. The switching matrix, while providing consistent ESD paths, also allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies. Furthermore, advanced algorithms ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards. A powerful, extraordinarily fast embedded VME controller drives the highest Speed-of-Test execution available. Data transfer between the embedded controller and the testers PC server, is handled through TCP/IP communication protocols, minimizing data transfer time. The testers PC server can be accessed through internal networks, as well as through the Internet, allowing remote access to the system to determine the systems status or to gather result information.

Key Features

Rapid-relay-based operations

Rapid-relay-based operations—up to 2304 channels.

Easy-to-use testing operations

Solid state matrix topology for rapid, easy-to-use testing operations.

Latch-Up stimulus and device biasing

Latch-Up stimulus and device biasing.

Excellent pulse source performance

High voltage power source chassis with patented HV isolation enables excellent pulse source performance.

Advanced device preconditioning

Fully compliant JESD78 latch-up testing allows high voltage/high current stressing to esure a robust design.

Remarkable test and throughput speeds

Massive parallelism drives remarkable test and throughput speeds.

Smaller, faster and smarter devices

Addresses global testing demands for today's modern designs and advanced packaging.


Specifications

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Test devices up to 2304 pins

  • Systems available configured as 1152, 1728 or 2304 pins

Waveform network

  • Two, 12 site HBM (100 pF/1500Ω) and optional MM (200 pF/0Ω) pulse sources address up to 12 devices simultaneously. Patented design ensures waveform compliance for generations to come.
Multiple device selection
  • When multiple devices are present; graphical display indicates the devices selected for test; progress indicator displays the current device under test (DUT), along with test status information 

Dimensions / Weight

  • 60 cm (23.5 in) W x 99 cm (39 in) D x 127 cm (50 in) H; 224 kg (500 lbs) 

Operating temperature

  • +19°C to +22°C (+66°F to +72°F)

Non-operating temperature 

  • 10°C to +60°C (+50°F to +140°F)

Humidity range

  • 30-60% non-condensing

System power requirements

  • 190-230VAC, 3 Phase, 5 wire, WYE configuration, 47-63Hz, 22A
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Applications

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ESD Semiconductor Qualification

Every electrostatic discharge (ESD) control plan is required to identify devices that are sensitive to ESD. We offer a complete suite of test systems to help with your device qualification requirements.

ESD Compliance Testing

Electrostatic discharge (ESD) can damage small features and structures in semiconductors and integrated circuits. We offer a comprehensive suite of test equipment which verifies that your devices meet targeted ESD compliance standards.

Learn more ›

ESD Compliance Testing

Electrostatic discharge (ESD) can damage small features and structures in semiconductors and integrated circuits. We offer a comprehensive suite of test equipment which verifies that your devices meet targeted ESD compliance standards.

Learn more ›

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Electron microscopy services for
semiconductors

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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