Talos Transmission Electron Microscopes

The Thermo Scientific Talos F200X  Scanning Transmission Electron Microscope ((S)TEM) combines outstanding high-resolution STEM imaging with high-performance EDS. Featuring four in-column SDD Super-X EDS Detectors, it delivers 2D and 3D chemical characterization plus compositional mapping with unique cleanliness.  Integrated with Thermo Scientific Velox Software, this platform generates high-accuracy and repeatable results, offering the multi-purpose versatility and heavy-duty flexibility that customers need for a diverse range of research and industrial applications.

Key features

• Cutting-edge energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for high-speed, high-quality elemental distribution and concentration analysis
• Simultaneous EDS and EELS can be utilized to analyze heavy and light elements with chemical bonding information 
• High resolution, EDS cleanliness, and high quality in 2D as well as 3D
• X-FEG and X-CFEG available for the highest brightness and energy resolution
• High accuracy and repeatable results with integrated Velox Software

The Thermo Scientific Talos F200S Scanning Transmission Electron Microscope ((S)TEM) provides essential high-resolution STEM imaging with features designed to enhance throughput, precision, and ease of use. As a practical alternative to the Talos F200X (S)TEM, it offers a more cost-effective solution for a wide range of applications in academic, government, and industrial research, delivering reliable performance for core imaging and analysis needs.

Key features

• Intuitive and easy-to-use automation software
• Available with Super-X EDS for rapid quantitative chemical analysis
• High throughput with simultaneous multi-signal acquisition

The Thermo Scientific Talos F200i Scanning Transmission Electron Microscope was uniquely designed for performance and productivity across a wide range of materials science applications. Featuring a more compact enclosure and a standard X-TWIN pole piece gap that enhances flexibility, it opens more opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

Key features

• Compact design with X-TWIN objective lens
• Available with S-FEG, X-FEG, or X-CFEG
• Fast, flexible EDS options for comprehensive elemental analysis

The Thermo Scientific Talos F200C (Scanning) Transmission Electron Microscope ((S)TEM provides a versatile, configurable STEM platform for multiple applications at the interface of life sciences and materials science. It can be configured as a cryo-EM solution for single particle analysis, tomography, and MicroED. It can also be configured as a room temperature solution for high-resolution imaging, EDS mapping, and tomography. It features a high-brightness X-FEG electron source with 20–200 kV acceleration voltage and stable electro-magnetic lenses (constant power lenses) as well as automation for microscope alignments and data collection. The microscope is completely enclosed in protection covers to simplify operating environments.

Key features

• High-contrast and high-quality STEM imaging
• 4k x 4k Ceta CMOS camera options for large FOV and high read-out speeds
• Large pole piece gap and multiple in situ options

The Thermo Scientific Talos L120C  (Scanning) Transmission Electron Microscope ((S)TEM provides a versatile, configurable STEM platform for routine imaging, mapping, and compositional analysis of samples. It can be configured for room temperature and cryo-EM imaging, including single particle analysis and tomography. It features either a tungsten or LaB6 filament as the electron source, with up to 120 kV acceleration voltage and many automated functions to make high-quality data acquisition simple.

Key features

• High versatility and stability
• 4k x 4k Ceta CMOS camera for speed and large FOV
• TEM magnification range of 25× to 650k×
• EDS and STEM options for compositional analysis

Specifically designed for semiconductor applications, the Thermo Scientific Talos F200E (S)TEM delivers fast, precise, quantitative characterization of semiconductor devices in multiple dimensions. With innovative features designed to optimize productivity, precision, and ease-of-use, the Talos F200E (S)TEM is the flexible solution for semiconductor analytical applications.

Key features

• Guaranteed minimized linear image distortion provides repeatable and accurate ground truth data
• Cutting-edge energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for high-speed, high-quality elemental distribution and concentration analysis
• Simultaneous EDS and EELS can be utilized to analyze heavy and light elements with chemical bonding information
• Maximum flexibility with live TEM image rotation, simultaneous operation of multiple STEM detectors, and integrated differential phase contrast (iDPC) imaging