Sample preparation for scanning/transmission electron microscopy (S/TEM) analysis is considered to be one of the most critical but challenging and time-consuming tasks in materials characterization labs. Conventional methods used to prepare ultra-thin samples required for S/TEM are slow, typically requiring many hours or even days of effort by highly trained personnel. This is further complicated by the variety of different materials and the need for site-specific information.
Thermo Fisher Scientific is building on over 25 years of expertise with DualBeam (FIB-SEM, focused ion beam – scanning electron microscopy) technology to give you cutting-edge sample preparation tools that are accessible, robust, and reliable. This begins with a highly stable column and high-quality source, which allows for excellent performance even at low voltages. Final polishing of the lamella using energies as low as 500 V greatly reduces damage, even to beam sensitive materials, and delivers unrivaled sample quality. For gallium-free sample preparation, Thermo Fisher Scientific has a broad portfolio of plasma FIB products, including the Thermo Scientific Helios Hydra DualBeam, which offers fast switching between four ion beam species; xenon, argon, oxygen, and nitrogen.
Additionally, Thermo Scientific SmartAlign Technology eliminates the need for any user alignments of the electron column, which not only minimizes maintenance, but also increases your productivity. Auto-tuning tools, embedded into the user interface, further increasing your ability to get high-quality images, tuning the image up to 10-times faster than standard manual alignment.
Quality hardware is supported by a suite of software solutions that enhance and simplify sample preparation. Thermo Scientific AutoTEM 5 Software enables fully automated in situ lamella preparation and lift-out, allowing even novice users to produce quality samples. This greatly expands the accessibility of the instrument, thereby increasing throughput as sample preparation is no longer reliant on expert operation. Moreover, full automation allows maximum utilization of system time with unattended overnight operation, resulting in greatly enhanced productivity.
S/TEM sample preparation with DualBeam instruments
1. Protective electron and ion beam deposition.
3. Undercutting and lamella lift out.
4. Sample thinning.
5. Low-energy final polishing.
Introducing Helios 5 DualBeam
Learn how advanced automation capabilities, increased robustness and stability enhancements in the Helios 5 and AutoTEM 5 software can significantly increase sample preparation throughput by allowing unattended and even overnight operation.
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
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the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.