48ab - Applications/Échantillons/Produits/Ressources/Nous contacter

The ability to perform compositional analysis, and visualize the resulting chemical maps in 3D, is essential to obtain the true elemental distribution or composition of a material, ultimately delivering new insights into the structure-function relationship of the sample.

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. Full 3D characterization includes chemical as well as imaging data, making 3D energy dispersive X-ray spectroscopy (EDS, also abbreviated EDX or XEDS) an indispensable technique. For the highest quality results, instrumentation with dynamic high-resolution imaging capabilities, as well as fast and quantitative data acquisition, is therefore required. The combination of flexibility in acquisition schemes (TEM, STEM, and EDS), the ability to easily and reproducibly optimize the experiment, and the fast and highly sensitive collection of the elemental distribution data are prerequisites for capturing the real 3D structure and composition of nanomaterials.

Electron tomography produces 3D reconstructions of materials by incrementally adjusting the angle at which the sample is observed. This produces a tilt series of images that can be digitally back projected to render the original sample volume. EDS spectra can be obtained alongside the the electron microscopy (EM) images, providing detailed elemental context. Below are just a few examples of EDS tomography use cases, covering a wide variety of scales, resolutions, and applications.

Thermo Fisher Scientific instruments offer a range of automation capabilities, allowing you to predetermine mapping conditions, drift compensation, and detector parameters, as well as autofocus and auto tilt conditions. This level of automation enables you to set up the EDS tomography experiment and then leave the system unattended for the complete data acquisition process. Visualization and reconstruction were performed with Thermo Scientific Inspect 3D and Avizo Software.


Resources

EDS tomography of P-Zn-In nanotubes, which are used as an electrode material for Na-ion and Li-ion batteries. The segregation of zinc has not been well known during synthesis; however, the elemental data clearly reveals the distribution of zinc relative to the other elements. It becomes evident that there is almost no concentration of zinc in the straight nanotubes. Sample courtesy of Dr. Reza Shahbazian Yassar, Michigan Tech University.

3D EDS TEM tomography of precipitates in an AlMgSi alloy. Sample courtesy of Thomas Kremmer and Stefan Pogatscher, University of Leoben, Austria.

EDS tomography data of organic nanoparticles in a polymer sheet.

EDS tomography data of a catalyst powder. Sample courtesy of Tampere University of Technology, Finland.

EDS tomography data of copper indium sulfide (CuInS2) nanostructures. Sample courtesy of Prof. Neerish Revaprasadu, University of Zululand, South Africa.

Example walkthrough of the EDS tomography workflow on the Talos S/TEM.
STEM and EDS tomography showing the distribution of the Palladium particles (red) relative to other elements of the vehicle aged catalyst material.
Digital slice of the reconstructed Ag-Pt core shell nanoparticle volume. Sample courtesy Prof. Yi Ding and Prof. Jun Luo, Center for Electron Microscopy, Tianjin University of Technology.
Segmented surface rendering of nanoparticles with elements present: Ag core, Platinum shell (to increase visibility, the Platinum shells have been colored semitransparent).

EDS tomography of P-Zn-In nanotubes, which are used as an electrode material for Na-ion and Li-ion batteries. The segregation of zinc has not been well known during synthesis; however, the elemental data clearly reveals the distribution of zinc relative to the other elements. It becomes evident that there is almost no concentration of zinc in the straight nanotubes. Sample courtesy of Dr. Reza Shahbazian Yassar, Michigan Tech University.

3D EDS TEM tomography of precipitates in an AlMgSi alloy. Sample courtesy of Thomas Kremmer and Stefan Pogatscher, University of Leoben, Austria.

EDS tomography data of organic nanoparticles in a polymer sheet.

EDS tomography data of a catalyst powder. Sample courtesy of Tampere University of Technology, Finland.

EDS tomography data of copper indium sulfide (CuInS2) nanostructures. Sample courtesy of Prof. Neerish Revaprasadu, University of Zululand, South Africa.

Example walkthrough of the EDS tomography workflow on the Talos S/TEM.
STEM and EDS tomography showing the distribution of the Palladium particles (red) relative to other elements of the vehicle aged catalyst material.
Digital slice of the reconstructed Ag-Pt core shell nanoparticle volume. Sample courtesy Prof. Yi Ding and Prof. Jun Luo, Center for Electron Microscopy, Tianjin University of Technology.
Segmented surface rendering of nanoparticles with elements present: Ag core, Platinum shell (to increase visibility, the Platinum shells have been colored semitransparent).

Applications

Process control using electron microscopy

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Aluminum mineral grain found with SEM during parts cleanliness testing

Technical Cleanliness

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Recherche sur les batteries

Le développement de batteries est possible grâce à une analyse multi-échelle avec la microCT, la SEM et la TEM, la spectroscopie Raman, la XPS ainsi que la visualisation et l’analyse 3D numériques. Découvrez comment cette approche fournit les informations structurelles et chimiques nécessaires à l’amélioration des batteries.

En savoir plus ›


Recherche sur les polymères

La microstructure des polymères détermine les caractéristiques et les performances globales du matériau. La microscopie électronique permet une analyse complète à échelle microscopique de la morphologie et de la composition des polymères pour les applications de recherche et développement (R&D) et de contrôle de la qualité.

En savoir plus ›


Recherche sur les métaux

La production efficace de métaux nécessite un contrôle précis des inclusions et des précipités. Nos outils automatisés peuvent effectuer toute une série de tâches essentielles à l’analyse des métaux, notamment le comptage des nanoparticules, l’analyse chimique par EDS et la préparation des échantillons par TEM.

En savoir plus ›


Nanoparticules

Les matériaux possèdent des propriétés fondamentalement différentes à l’échelle nanométrique par rapport à l’échelle macroscopique. Pour les étudier, les instruments de S/TEM peuvent être associés à la spectroscopie à rayons X à dispersion d’énergie pour obtenir des données de résolution à l’échelle du nanomètre, voire inférieure au nanomètre.

En savoir plus ›


Pétrole et gaz

Comme la demande de pétrole et de gaz ne cesse de croître, il existe un besoin continu de procéder à une extraction efficace et rentable des hydrocarbures. Thermo Fisher Scientific propose une gamme de solutions de microscopie et de spectroscopie pour une variété d’applications de sciences pétrolières.

En savoir plus ›


Recherche géologique

La géoscience repose sur une observation uniforme et précise multi-échelle des caractéristiques des échantillons de roches. La SEM-EDS, associée à un logiciel d’automatisation, permet une analyse directe à grande échelle de la texture et de la composition minérale pour la recherche en métrologie et en minéralogie.

En savoir plus ›


Recherche dans le domaine de la catalyse

Les catalyseurs sont essentiels pour la majorité des processus industriels modernes. Leur efficacité dépend de la composition microscopique et de la morphologie des particules catalytiques ; l’EM avec l’EDS est parfaitement adaptée à l’étude de ces propriétés.

En savoir plus ›


Tests de matériaux automobiles

Chaque composant d’un véhicule moderne est conçu pour assurer la sécurité, l’efficacité et les performances. La caractérisation détaillée des matériaux automobiles à l’aide de la spectroscopie et de la microscopie électronique éclaire les décisions critiques concernant les processus, les améliorations des produits et les nouveaux matériaux.

En savoir plus ›


Fibres et filtres

Le diamètre, la morphologie et la densité des fibres synthétiques sont des paramètres clés qui déterminent la durée de vie et la fonctionnalité d’un filtre. La microscopie électronique à balayage (SEM) est la technique idéale pour étudier rapidement et facilement ces caractéristiques.

En savoir plus ›


Products

Style Sheet for Instrument Cards Original

Iliad (S)TEM

  • Advanced integration of EELS and (S)TEM optics
  • Electrostatic beam blanker
  • High energy resolution electron source

Helios 5 Laser PFIB System

  • Fast, millimeter-scale cross sections
  • Statistically relevant deep subsurface and 3D data analysis
  • Shares all capabilities of the Helios 5 PFIB platform

Spectra Ultra

  • New imaging and spectroscopy capabilities on the most beam sensitive materials
  • A leap forward in EDX detection with Ultra-X
  • Column designed to maintain sample integrity.

Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV
Thermo Scientific Talos F200C transmission electron microscope (TEM)

Talos F200C TEM

  • High-contrast and high-quality TEM and STEM imaging
  • 4k x 4k Ceta CMOS camera options for large FOV and high read-out speeds
  • Large pole piece gap and multiple in situ options
Thermo Scientific Talos L120C transmission electron microscope (TEM)

Talos 12 TEM

  • Proven and versatile (S)TEM
  • Multidisciplinary 120 kV TEM
  • TEM magnification range of 25X to 650kX
  • EDS and STEM options for compositional analyses

Talos F200i TEM

  • Compact design with X-TWIN objective lens
  • Available with S-FEG, X-FEG, and X-CFEG
  • Flexible and fast EDS options for comprehensive elemental analysis

Talos F200S TEM

  • Intuitive and easy-to-use automation software
  • Available with Super-X EDS for rapid quantitative chemical analysis
  • High-throughput with simultaneous multi-signal acquisition

Talos F200X TEM

  • High-resolution, EDS cleanliness, and quality in 2D as well as 3D
  • X-FEG and X-CFEG available for the highest brightness and energy resolution
  • High accuracy and repeatable results with integrated Thermo Scientific Velox Software

Phenom ParticleX Battery Desktop SEM

  • Versatile solution for high-quality, in-house analysis
  • Automated system and analysis of multiple samples
  • Testing 10x faster

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control and setup
Thermo Scientific Inspect 3D tomography software

Inspect 3D Software

  • Image processing tools and filters for cross-correlation
  • Feature tracking for image alignment
  • Algebraic reconstruction technique for iterative projection comparison

Avizo Software
Materials Science

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Style Sheet for Komodo Tabs
Style Sheet to change H2 style to p with em-h2-header class

Contact us

Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards

Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.