About Lin Jiang
Dr. Lin Jiang is a Product Marketing Manager at Thermo Fisher Scientific specializing in automated transmission electron microscopy solutions for semiconductor metrology, helping manufacturers produce more efficient chips with higher yields. Lin has an extensive background in the TEM analysis of advanced materials, and is highly familiar with the characterization needs of both metallurgical and semiconductor industries. He received his PhD in Materials Science from Shanghai Jiao Tong University and performed post-doctoral work at UC Davis, UC Irvine, and Berkeley National Laboratory. Throughout his career, Lin Jiang has published over 80 papers in top journals like Nature Nanotechnology and Nature Communications.
Expertise and focus
Lin’s areas of focus include transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), semiconductor metrology, and other advanced materials characterization methods. His work reflects a strong interest in translating atomic-scale characterization into practical insights and more efficient scientific workflows.
For semiconductor applications, Lin has focused on advances in automated TEM metrology, including high-volume data acquisition, laboratory automation, and stronger integration of TEM workflows with semiconductor fabrication environments. His interests encompass the metrology challenges created by increasingly complex device architectures, including gate-all-around transistors, backside power delivery, continued 2D scaling, and 3D structures.
Scientific perspective
Lin’s scientific perspective centers on making atomic-scale information more accessible and actionable. Across semiconductor metrology and materials research, his work highlights the value of combining advanced microscopy with automation, high-quality data acquisition, and connected analytical workflows.
