About Mark Najarian
Mark Najarian is a Product Marketing Manager, Semiconductor at Thermo Fisher Scientific, specializing in next-generation semiconductor fab solutions. He has worked in the semiconductor industry for approximately twenty years, supporting advanced node development, yield ramp, failure analysis, and process monitoring. In his current role, he focuses on in-line wafer metrology products that integrate focused ion beam and scanning electron microscopy methods to meet the evolving needs of semiconductor manufacturing.
Mark Najarian earned a B.S. in Chemistry at the University of California, Santa Barbara, and an M.S. in Nanoscale Materials Science and Engineering at the University of California, Berkeley. He has been granted several patents enabling advances in 3D SEM metrology. He is a contributing author to research featured in Nature and Advanced Materials and is recognized as a leader in the global semiconductor metrology community.
Expertise and focus
Mark’s expertise includes semiconductor process development, in-line metrology, and defect analysis using combined imaging and analytical tools. He works with solutions that deliver high-resolution insights directly in the fab, enabling fast, accurate three-dimensional metrology and defect characterization. His background spans critical workflows such as cross-sectioning, angled milling, and volume tomography through sequential imaging and analysis, which support decision-making for advanced logic, memory, and packaging technologies.
Scientific perspective
Mark brings a perspective that integrates a practical understanding of physical defects with the technical capabilities of advanced metrology systems. He focuses on how automated three-dimensional measurement and defect analysis can accelerate time-to-yield, improve process control, and strengthen confidence in results at scale. His work reflects a deep familiarity with semiconductor challenges as device features shrink and integration complexity increases, and how in-fab analytical solutions contribute to addressing these challenges.
