What features should you look for when purchasing a Wavelength Dispersive X-ray Fluorescence (WDXRF) spectrometer for advanced materials characterization of your mining materials? Before moving down your check-off list, make sure the spectrometer integrates bulk elemental analysis capabilities with mapping and small spot analysis. You should also ensure your solution offers unmatched versatility and performance for the analysis of any mining, mineral and rock samples. To find that solution, consider these 12 features before purchasing:
- Elemental analysis and distribution from Beryllium (Be) to Uranium (U) in:
- Inorganic and organic materials
- Solids and liquids
- Bulk, small and thin samples
- Speed
- Automated sample changer for unattended or batch analysis
- Multiple positions for cassettes or samples
- Priority sample positions
- Dual sample loading
- Fully automatic unattended operation
- High Performance
- Optical encoder
- Multiple collimators, crystals, and detectors
- Extreme precision
- Digitally mastered goniometric scanning technology
- Ultra closely coupled optics
- Compact geometries
- Smart excitation technology
- Complete periodic table performance
- High Sensitivity
- 50 micron Be window for light elements
- Optional 70kV for heavy elements
- Small sample analysis
- Viewed diameter from 5-35mm
- Pinpoint focus for small spot analysis: x-ray beam diameters of 0.5mm, 1.5mm, or 3mm
- Elemental mapping
- Area visualization with camera
- Elemental analysis and cartography overlay
- Safe liquid and fine powder analysis
- Protection of x-ray tube, auto recognition of liquid or solid sample
- Dust/Liquid collection device
- Helium shutter to preserve vacuum
- Integrated Primary Beam Filters (PBF)
- Remote diagnostics
- Easy maintenance.
Watch this video to see an animated inside view of a Sequential X-Ray Fluorescence Spectrometer.
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