Metrios 6 Smart Automation streamlines TEM metrology and failure analysis

Ready to remove bottlenecks in semiconductor TEM metrology and failure analysis?

Discover how Thermo Scientific Metrios 6 Smart Automation is streamlining TEM analysis with intelligent, recipe-free automation.

Transform your TEM metrology with intelligent, recipe-free automation using Metrios Smart Automation.
Streamline workflows across a wide range of semiconductor applications, including advanced logic and 3D NAND.
Leverage machine learning and computer vision for precise, consistent results with minimal user input.

Download our application note to learn how this intuitive solution accelerates workflows for process control and failure analysis.

Fill the form below to download the app note:

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