The Element 2 and Element XR High-Resolution ICP-MS provide class-leading elimination of interferences for the highest level of confidence. With ultra-sensitive and reliable multi-element analyses at trace-level concentrations, there’s no need for complicated sample preparation and method development.

In mass spectrometry, spectral interferences occur when the mass-to-charge ratio (m/z) of interfering ions overlap with analyte ions. These interferences are the primary limitation of ICP-MS. Fortunately, there’s a better way. The high mass resolution potential of a sector-field mass spectrometer can physically distinguish and separate an analyte from interferences by exploiting small differences in mass-to-charge. Therefore, high resolution (HR) ICP-MS can quantify concentrations and determine precise isotope ratios for elements across nearly the entire periodic table, regardless of the sample matrix.

The simplicity of high-resolution ICP-MS allows the most advanced performance, without compromising on straightforward and reliable method development. This makes the Element series the platform of choice in top-level research and metrology institutions, as well as advanced routine analysis laboratories across the globe.

Features and benefits

• High mass resolution: Accurately measure isotope signals separate from spectral interferences and produce clean elemental spectra while retaining flexibility.
• Straightforward analytical methods: Providing visual confirmation of accurate measurements.
• Interference removal: no use of reactive gases.
• High sensitivity: Get accurate and precise multi-element analysis down to pg·L-1 concentrations for all resolutions. The Element XR HR-ICP-MS increases the linear dynamic range by an additional three orders of magnitude for maximum flexibility.
• Ideal for transient multi-elemental signals, such as laser ablation, HPLC, GC, CE, FFF.
• High-precision isotope ratios.
• An advanced research tool with the reliability and robustness to serve in 24/7 production control.