TOFWERK ToFSIMS HDF5 Reader

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a trusted spectroscopic technique which collects and separates isotopes according to their mass-to-charge ratio (m/z). This module allows for reading back specific isotope(s) from the HDF5 file produced by TOFWERK ToF-SIMS detector.

If you want to use this Xtra, please click on Request Information on this page. You will be driven to a contact form where you can inquire for a demo and/or commercial information and discussion.