The Thermo Scientific Talos F200i S/TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

More materials science on one flexible tool

Designed for multi-user and multi-discipline environments, the Talos F200i S/TEM is also ideal for novice users. It is equipped with the Thermo Scientific Velox user interface, which is immediately familiar since it is shared across all Thermo Scientific TEM platforms. All TEM daily tunings have been automated to provide the best and most reproducible setup. The Align Genie automation software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator. A side-entry retractable Energy Dispersive X-ray Spectroscopy (EDS) detector can be added to the configuration to enable chemical analysis.

Compact design

The smaller footprint and dimensions of the Talos F200i facilitate accommodation of this tool in more challenging spaces. In addition, this compact design eases access for service needs while also reducing infrastructure and support costs.

Productivity for all users

To further enhance productivity, especially in multi-user, multi-material environments, the constant-power objective lenses, low-hysteresis design, and remote operation with SmartCam allow for straightforward reproducible mode and high-tension switches. The Talos F200i S/TEM also features educational online help. Simply pressing F1 with the mouse hovering over a control panel quickly opens relevant information.

 

Key Features

Available with dual EDS technology

Choose the best EDS detector for your needs, ranging from a single 30 mm² detector to dual 100 mm² detectors for high throughput (or low-dose) analytics.

High-quality S/TEM images and accurate EDS

Acquire high-quality TEM or S/TEM images with the innovative and intuitive Velox Software user interface in very a simple way. Unique EDS absorption correction in Velox Software enables the most accurate quantification.

Best all-round in situ capabilities

Add tomography or in situ sample holders. Fast cameras, smart software, and our wide X-TWIN objective lens gap enable 3D imaging and in situdata acquisition with minimal compromise to resolution and analytical capabilities.

Increased productivity

Ultra-stable column and remote operation with SmartCam and constant-power objective lenses for swift mode and HT switches. Fast and easy switching for multi-user environments.

Most repeatable data

All daily TEM tunings, such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points and rotation center are automated, ensuring you always start from optimum imaging conditions. Experiments can be repeated reproducibly, allowing more focus on research instead of the tool.

Large field-of-view imaging at high speed

The 4k × 4k Ceta CMOS camera with its large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range.

Compact design

Smaller footprint and dimensions facilitate accommodating this tool in more challenging spaces while reducing infrastructure and support costs.


Specifications

Style Sheet for Products Table Specifications
TEM
  • Line resolution: ≤0.10 nm
Vacuum system
  • Airlock pumping: Oil- and vibration-free
  • Cold trap: Standard
  • Long-duration Dewar: Optional - at least 4 days stand-time (between refills)
STEM imaging
  • STEM resolution: ≤0.16 nm
  • Detectors: HAADF and/or On-axis Panther BF/DF
Energy disersive x-ray spectroscopy (EDS)
  • Detector size (Bruker X-flash): 30, 100 and Dual 100
  • Retractable: Yes, motorized
  • EDS energy resolution: 129 eV
Style Sheet for Techniques (LONG VERSION) and Media Gallery Tab
HAADF HRSTEM image of Potassium Tungsten Niobate.
HAADF HRSTEM image of Potassium Tungsten Niobate [001] showing the stability of the Talos F200i.
CBED pattern on Silicon.
CBED pattern on Silicon [011] showing Talos F200i flexibility and superior dynamic range of the Ceta 16M camera.

Introduction to Dual-X Technology.

HAADF HRSTEM image of Potassium Tungsten Niobate.
HAADF HRSTEM image of Potassium Tungsten Niobate [001] showing the stability of the Talos F200i.
CBED pattern on Silicon.
CBED pattern on Silicon [011] showing Talos F200i flexibility and superior dynamic range of the Ceta 16M camera.

Introduction to Dual-X Technology.

Applications

Process Control_Thumb_274x180_144DPI

Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Electron Energy Loss Spectroscopy

Materials science research benefits from high-resolution EELS for a wide range of analytical applications. This includes high-throughput, high signal-to-noise-ratio elemental mapping, as well as probing of oxidation states and surface phonons.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Electron Energy Loss Spectroscopy

Materials science research benefits from high-resolution EELS for a wide range of analytical applications. This includes high-throughput, high signal-to-noise-ratio elemental mapping, as well as probing of oxidation states and surface phonons.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Contact us

Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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