Microanalysis and Electron Microscopy
Introducing a better way to do X-ray microanalysis

Thermo Scientific™ Pathfinder™ X-ray microanalysis for SEM/EDS and SEM/WDS avoids the many pitfalls found in traditional elemental-based X-ray microanalysis. Using Spectral Imaging data as its foundation along with an array of processing algorithms that assure the most precise data possible, Pathfinder software goes straight to the classification of the chemical phases in your sample. Useful information arrives in minutes, cleanly and without any analytical bias. Pathfinder software to changes the way you use EDS/EDX and WDS/WDX.

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Featured microanalysis and electron microscopy products

Pathfinder-All types

Thermo Scientific™ Pathfinder™ X-ray Microanalysis software works in concert with your electron microscope for energy-dispersive spectroscopy (EDS) and wavelength-dispersive spectroscopy (WDS). Pathfinder software processes incoming data from the latest X-ray detector technology in novel and efficient ways, dramatically reducing analysis time from hours to minutes.

Achieve unparalleled speed and confidence in your elemental analyses with this spectrometer. Its built-in expert system automatically handles alignment, analysis settings, and data acquisitions to produce a truly integrated EDS/WDS system—making high resolution microanalysis as easy to use as an EDS system.

WDS MagnaRay Spectrometer
UltraDry EDS Detector

Develop more accurate interpretations of X-rays faster with this detector, which provides superior resolution at incredibly high collection rates. Used with the NORAN™ System 7, it is ideal for metals and mining, advanced materials and semiconductors. 

Put the power and convenience of a silicon drift EDS detector on your scanning electron microscope (SEM) with the Thermo Scientific™ UltraDry™ Compact EDS Detector. The UltraDry detector is a is a fully integrated extension of the Thermo Scientific™ NORAN™ System 7 architecture.

UltraDry Compact EDS Detector

Upcoming event

Microscopy & Microanalysis 2016 Meeting
July 24-28, 2016
Columbus Convention Center, Columbus, Ohio

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Microscopy and Microanalysis 2016 Meeting