Thermo Scientific™

Lumis EBSD Detector

Catalog number: EBSD-LUMIS
Thermo Scientific™

Lumis EBSD Detector

Catalog number: EBSD-LUMIS
Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution. The Thermo Scientific™ Lumis EBSD detector incorporates new CMOS sensor technology and advanced optics, which is harnessed with Thermo Scientific Pathfinder 2.0 microanalysis software that includes new indexing algorithms for the analysis of electron backscatter patterns (EBSPs).
 
Catalog Number
EBSD-LUMIS
Unit Size
Each
Description
Lumis EBSD detector for SEMs
Price (USD)
Full specifications
Indexed Pattern Acquisition Rate4096 x 4096 pixels at 1 ms dwell time
Insert/RetractSoftware controlled insertion / retraction, <100 μm accuracy
Operating SystemWindows 10, Windows 7 compatible
PhosphorOctagonal for optimal light throughput and solid angle balance
Resolution1920 x 1200 pixels, binning down to 4x4 plus optical zoom
Software Data AcquisitionAutomatic EBSP analysis with advanced settings
CameraHigh sensitivity CMOS, reverse zoom optics lens
Data Processing and DisplaysMapping – display of EBSP quality, phase, orientation, grain boundaries, special boundaries (e.g. CSL), and texture; Grain reconstruction – grain size, shape, morphology; Pole figure, Inverse pole figure, ODF
DescriptionLumis EBSD detector for SEMs
Unit SizeEach
Showing 1 of 1
Catalog NumberSpecificationsUnit SizeDescriptionPrice (USD)
EBSD-LUMISFull specifications
EachLumis EBSD detector for SEMsRequest A Quote
Indexed Pattern Acquisition Rate4096 x 4096 pixels at 1 ms dwell time
Insert/RetractSoftware controlled insertion / retraction, <100 μm accuracy
Operating SystemWindows 10, Windows 7 compatible
PhosphorOctagonal for optimal light throughput and solid angle balance
Resolution1920 x 1200 pixels, binning down to 4x4 plus optical zoom
Software Data AcquisitionAutomatic EBSP analysis with advanced settings
CameraHigh sensitivity CMOS, reverse zoom optics lens
Data Processing and DisplaysMapping – display of EBSP quality, phase, orientation, grain boundaries, special boundaries (e.g. CSL), and texture; Grain reconstruction – grain size, shape, morphology; Pole figure, Inverse pole figure, ODF
DescriptionLumis EBSD detector for SEMs
Unit SizeEach
Showing 1 of 1

The Lumis EBSD detector incorporates the most developed CMOS sensor technology available with advanced optics and accelerating indexing algorithms for the analysis of electron backscatter patterns (EBSPs) using probe currents down to 10 pA and below.

With pattern collection at >2.2 million pixels, the detector is ideally suited to HR-EBSD strain measurement and phase identification applications.

Using optical and sensor binning, the detector can be optimized for high speed EBSD at several thousand frames per second for reduced collection times and higher sample throughputs. The advanced optics and high sensor sensitivity allow EBSPs to be acquired at ultra-low probe currents below 10 pA. This is particularly important for beam sensitive and dose restricted materials, or in cases where higher probe current may introduce contamination or drift.

A large format CMOS sensor and a patented reverse zoom optic to complement and extend the built-in CMOS sensor binning. A high efficiency, octagonal scintillator converts the electron backscatter electrons into light, which is focused on to a user-controlled region of the sensor by the high-quality reverse zoom optic. This allows a continuous choice of "binned" EBSP size and gives full flexibility over EBSP speed, quality and sensitivity.

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Frequently asked questions (FAQs)

Citations & References