Nanometer-sized particles are present in many different materials, from food additives to high-performance metals to catalysts used for process optimization. As part of the process to enhance the properties of everyday materials, the characterization of nanoparticles involves the exploration and manipulation of structures at the nanoscale. Quantification of the composition, size, and shape of nanoparticles in these everyday objects is a crucial first step in furthering our understanding of the relationships between nanoparticles, performance, quality, and safety.

The Thermo Scientific Automated Particle Workflow (APW) improves the research and product development process for industrial, academic, and government labs by providing an all-in-one software package that streamlines chemical analysis workflows.

APW is the only solution that automates the entire workflow, from acquisition to automated processing. With APW, you can quickly acquire statistically relevant, high-resolution (nanoscale) results over a large area. APW’s seamless integration with Thermo Scientific Talos (S)TEM and Thermo Scientific Spectra (S)TEM instruments and Thermo Scientific Maps EDS Software makes it possible to obtain data with much higher statistics (50 in total vs. >500/hour), while also simplifying the process.


Dynamic software integration that streamlines chemical analysis

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Higher productivity

APW can empower you to accelerate your time-to-results. APW’s fully automated solution expedites data collection by allowing you to rapidly screen new products and processes, while allowing you to analyze more samples in a shorter amount of time.

By automating routine nanoscale imaging and chemical analysis tasks overnight, APW increases TEM productivity. This new-found availability frees up the TEM for other R&D, which can result in higher yield in finding smarter materials, and it can provide faster ramp-up for the research of new products.

Decreased cost per measurement

APW can lower your cost per measurement through unattended, repeatable processes. Its automation capabilities allow you to quickly run complex workflows and eliminate the chance of human error inherent in manual processes, resulting in faster processes and more precise results.

Ease of use through automation and unattended use

APW is easy to use, so you do not need to be an expert microscopist to realize its benefits. Regardless of your experience level, you will be able to focus more attention on your materials science instead of the tool. APW’s integration with existing workflows and enhanced automation makes this software package efficient and user-friendly, and it runs unattended.

Wide range of experiments

You can run a wide range of experiments on many different types of materials. The experimental techniques possible with APW, including energy dispersive X-ray spectroscopy (EDS), support research related to metals, catalysis, foods, paints, asbestos, and more. Data collected and analyzed by APW includes nanoparticle morphology, chemical composition, and structural information (size, shape, distribution), allowing more research questions to be answered and, ultimately, enhancing product quality.

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Automated Particle Workflow in Action

 

The APW package provides all the necessary software and hardware for easy, automated, and unattended analysis of your sample with STEM and EDS, giving you the scientifically meaningful statistics that you need. APW contains a computer upgrade for the Talos TEM or Spectra (S)TEM, acquisition software (Thermo Scientific Maps 3 Software for (S)TEM and EDS, enabled by Thermo Scientific Velox Software), processing software (Thermo Scientific Avizo2D Software) on a dedicated data processing computer, and a bridge between the acquisition and processing software.


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Applications

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Process Control

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Techniques

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

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EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Samples


Nanoparticles

Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

Learn more ›


Products

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Spectra Ultra

  • New imaging and spectroscopy capabilities on the most beam sensitive materials
  • A leap forward in EDX detection with Ultra-X
  • Column designed to maintain sample integrity.

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • High resolution/throughput in STEM imaging and chemical analysis
  • Add in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Avizo Software
Materials Science

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up

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Electron microscopy services for
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To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.