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Transmission electron microscopy (TEM) provides critical insights across industries and disciplines, allowing you to view materials and samples at sub-nanometer, or even atomic, resolution.
TEM examines samples by transmitting a beam of electrons through a very thin specimen, imaging the internal structure and fine details of the sample, such as atomic arrangements and crystal structures. Advances in hardware and software have made this vital tool more accessible and versatile than ever before, capable of providing multiple analyses in one instrument, including scanning transmission electron microscopy, energy-dispersive X-ray spectroscopy, electron-energy loss spectroscopy, and more.
Learn about transmission electron microscopy, and the capabilities of Thermo Scientific TEM instrumentation, with the informational resources below.
For Research Use Only. Not for use in diagnostic procedures.