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Advanced analysis of metal powders for additive manufacturing: Meet industrial quality standards with confidence
With the Thermo Scientific Phenom ParticleX AM Desktop SEM, you can analyze the composition and size of particles—as well as shape parameters such as diameter, perimeter, aspect ratio, roughness, and Feret diameter—all at the microscale and with far greater precision than other technologies. This proven solution is an ideal choice for monitoring the three most critical characteristics of metal powders: particle size distributions, individual particle morphology, and foreign particles.
Industry-leading throughput
The Phenom ParticleX AM Desktop SEM offers faster throughput than other SEMs, helping you to maximize your microscope's usage and accelerate your production cycle time.
Automated efficiency from sample to report
Thermo Scientific Perception Software's integrated automation features make this system incredibly easy to use, delivering actionable, ready-to-read reports that summarize findings without bias—all with minimal effort required. It can visualize data at the 10%, 50%, and 90% values or on a number- or volume-based scale, helping you make clear and actionable decisions around quality manufacturing.
Elemental analysis enhanced by integrated EDS detector
The integrated energy dispersive spectroscopy (EDS) detector and optional secondary electron detector (SED) bring a new dimension to your elemental analysis. Features like single-click mapping and line scan functionality help you analyze edges, coatings, and cross-sections of samples with multiple layers, such as paints and other coatings. The fully integrated EDS enables elemental analysis and classification of each individual particle, allowing you to readily identify any foreign particulates in your powder from previous printing cycles and maintain quality feedstock.
Comprehensive particle characterization
Quantify various size and shape parameters, such as minimum and maximum diameter, perimeter, aspect ratio, roughness, and Feret diameter. Clearly differentiate between satellite particles, spherical particles, deformed particles, and agglomerates of primary particles to thoroughly understand your material's properties and enhance your quality control processes.
Phenom ParticleX AM Desktop SEM technical specifications
| Phenom ParticleX AM Desktop SEM | |
| Sample size |
|
| Source type |
Cerium hexaboride (CeB6) |
| Max. resolution |
<10 nm |
| Detectors and signals |
|
| Software options and accessories |
|
| Footprint |
93 (w) x 293 (d) x 290 (h) mm, 5.6 kg |
| Acceleration voltage range |
5 kV to 15 kV Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode |
| Low vacuum mode (stating pressure ranges) | 0.1 Pa – 1 Pa – 60 Pa |
For Research Use Only. Not for use in diagnostic procedures.