General Archives - Page 2 of 8 - Advancing Materials

The versatile, easy-to-use Phenom ParticleX Steel SEM enables users to perform flexible SEM-EDS root cause analyses during the day (left), while automating routine analyses overnight and on weekends (right).

Accelerating Higher-Value Steel Manufacturing

From the bridges and vehicles that form our transportation s...

MicroCT produces 3D images based on the fact that harder materials absorb more X-rays and lighter materials allow more X-rays to pass through.

Three Ways Helical Scanning Can Improve Your MicroCT Materials S...

MicroCT in materials science Micro-computed tomography (micr...

Nanoprobing technology uses probing positioners that can be manipulated and precisely placed on the sample to significantly improve TEM imaging success rates.

Nanoprobing: A Must-Have Failure Analysis Technique for Today’...

Semiconductor electrical fault isolation As semiconductor de...

The robust and versatile Phenom Pro/ProX G6 Desktop SEM enables academic labs to advance their research by effectively analyzing a larger number of samples, while reserving their high-end SEM for more challenging samples.

Six Ways the Phenom Pro/ProX G6 Desktop SEM Can Accelerate Break...

Microstructure analysis with SEM As academic labs around the...

The first-of-its-kind Helios 5 Laser PFIB enables fast sub-surface and 3D characterization at millimeter-scale with nanometer resolution.

Capturing Faster Materials Insights with the Helios 5 Laser PFIB

From the fan blades that power jet engines to the alloys use...

This map shows an oxide inclusion comprised of calcium aluminate liquid phase (purple) and crystals of solid magnesium oxide (green).

Producing Clean Steel Using ColorSEM Technology

As worldwide demand for high-quality steel continues, it’s...

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