Microscopy2022 Archives - Page 3 of 9 - Advancing Materials

A geologic sample merging data from SEM-EDS, EDS, and a standalone Raman microscope. Maps software makes it easy to combine all of your imagery into a single environment for simultaneous viewing and interpretation.

Data Analysis Software for Materials Scientists

To fully characterize their materials, today’s materia... by Eric Goergen / 03.26.2020

The Phenom XL G2 Desktop SEM offers a versatile solution for automating the quality control process.

New Phenom XL G2 Desktop SEM Improves Quality Control with Advan...

Over the years, scanning electron microscopes (SEMs) have se... by Alexander Bouman / 03.23.2020

SEM image of a fly's eye

Expert Sample Preparation Techniques for SEMs

When using a scanning electron microscope (SEM) for the firs... by Erik Luyk / 01.16.2020

Cross-section view of an electron column with a schematic view of the source assembly

Five Reasons to Choose an CeB6 vs. a Tungsten Electron Source

Considering a desktop scanning electron microscope (SEM)? If... by Erik Luyk / 01.09.2020

Two photos with very different depths of fields. (Left) A close-up of a flower – when the picture is taken from a short distance, the background will be blurred. (Right) A landscape picture – the longer distance increases the depth of field from a few centimeters to several kilometers.

Optimizing the Depth of Field in an SEM

Depth of field in SEM imaging When it comes to “dep... by Erik Luyk / 01.02.2020

(Left) Charging effect on a non-conductive sample. (Right) Backscatter electron detector imaging of this sample after 10 nm gold coating is applied.

Sputter Coating for SEM: How This Sample Preparation Technique A...

Challenging samples for SEM Scanning electron microsc... by Erik Luyk / 12.26.2019

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