Analytical solutions for chemical and impurity control across semiconductor manufacturing

Chemical purity and consistent process control are critical across semiconductor manufacturing. Trace-level contamination in materials, chemicals, and gases can directly affect yield and reliability, making advanced chemical analysis essential for impurity monitoring and quality verification.

Thermo Fisher Scientific delivers comprehensive solutions designed to support these analytical needs across the semiconductor workflow.

Download the Analytical Solutions in Semiconductor guide to learn about:

Chromatography and mass spectrometry workflows for trace impurity detection, contamination control, and chemical characterization
Elemental, inorganic, and organic analysis of process chemicals, solvents, gases, and ultrapure water using ICP-MS, IC, GC-MS, and LC-MS
Structural, electrical, and spectroscopic analysis techniques supporting materials characterization and defect analysis
Integrated analytical systems, on-line gas monitoring, and automated sample preparation solutions designed to improve data quality, throughput, and reproducibility across semiconductor manufacturing

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