Environmental scanning electron microscopy instruments

While electron microscopy has long been the benchmark for materials structural analysis, it has been limited to samples that are stable under vacuum. This generally does not represent the conditions experienced by the material in its native operating environment and can limit your understanding of its properties and behavior. Furthermore, modern materials science research is also focusing on more complex materials. These materials are typically   nonconductive, dirty, wet, chemically reactive, or outgassing. Truly relevant observations require high-resolution imaging and analysis under various experimental and environmental conditions. Sample preparation would ideally also be minimized to preserve the original state of the material.

 

Environmental scanning electron microscopy (ESEM) expands the boundaries of traditional SEM to deliver deeper insights into all types of samples. ESEM allows for imaging of samples with minimal preparation and adds variables such as hydration, thermal cycling, and the introduction of gas to characterize in situ changes. Using water vapor and a temperature control stage, some of the “impossible to image samples” such as hydrated samples or highly outgassing samples (whose properties can easily be characterized.

Environmental scanning electron microscopy can be performed on our flexible and intuitive microscopes without compromising on resolution. These ultra-versatile SEMs combine all-around high-resolution imaging with analytical measurements in on sample in their natural state.


In situ heating microscopy

Real-world materials analyses ideally takes place under variable environmental conditions, such as increasing or decreasing temperatures. The behavior of your heated material as it (re)crystallizes, melts, or deforms can inform critical macro- and microscopic observations, such as how a manufactured part responds to stress or how feed materials behave during production. A sample’s response to heat is a dynamic process, so it must be paired with dynamic observation for accurate insight. Modern heating stages in electron microscopes allow for in situ experiments for high-resolution observation of heated materials. These demanding experiments are capable of linking sample morphology, environment, and thermodynamics, and can help you control the corresponding behavior of the bulk material.

Two-phase Co-Sb alloy during heating to 700°C on the High Vacuum Heating Stage. The antimony-rich phase sublimated during heating, causing exposure of the second phase.

SEM heating stages

There are many considerations when operating electron microscopes at elevated temperatures, such as the desired temperature range, sample size, and chemical environment. The following table shows what is possible with Thermo Scientific temperature stages.

Name Application Temperature Max. Sample Size Environment
High vacuum heating stage General-purpose heating, high resolution imaging, in-column detection, fast processes, electron-backscatter diffraction (EBSD)

Up to 1100°C

(EBSD up to 900°C)

10 mm High vacuum
Environmental SEM (ESEM) stage Heating in gaseous environment: oxidation or other chemical reactions Up to 1000°C or 1400°C, depending on the model 5 mm ESEM
µHeater Powder heating, chunk lift-out studies (DualBeam), STEM imaging, high-temperature EBSD and EDS, ramp rate of 10,000°C/s Up to 1200°C 50 µm Any
Cooling stage, WetSTEM Precise control over humidity, wetting studies, modest heating -20°C to +60°C 3 mm ESEM

In situ SEM, TEM, and FIB SEM DualBeam instruments

Verios 5 XHR SEM

Scanning electron microscopy characterization of nanomaterials with sub-nanometer resolution and high material contrast

The Thermo Scientific  Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Exceptional levels of automation and ease-of-use make this performance accessible to users of any experience level.

Quattro ESEM

An environmental scanning electron microscope (ESEM) for the study of materials in their natural state

The Thermo Scientific Quattro ESEM combines versatile imaging and analytics performance with an environmental mode (ESEM) for studying samples in their natural state. It suits academic, industrial, and government labs with varied user backgrounds and research disciplines while still supporting the ability to run particular in situ experiments.

The Quattro ESEM is equipped with a field emission gun (FEG) for exceptional resolution and features three vacuum modes (high vacuum, low vacuum, and ESEM) to accommodate a wide range of samples, including those prone to outgassing or incompatible with vacuum conditions.

Apreo ChemiSEM

High-performance imaging with integrated chemical analysis and structural characterization

The Thermo Scientific Apreo ChemiSEM System supports your materials science research by simplifying the imaging process, making it accessible to both expert users and newcomers alike. With innovative features like Smart Frame Integration (SFI) and newly developed autofocus and autostigmation functions, it can help you easily obtain clear, high-resolution images as well as results for elemental analysis (EDS) and diffraction (EBSD).

Prisma E SEM

Scanning electron microscope for industrial research and development with environmental scanning electron microscope capability

The Thermo Scientific Prisma E Scanning Electron Microscope (SEM) integrates various imaging and analytical features with advanced automation, offering the most comprehensive solution of any instrument in its class. Ideal for industrial research, quality control, and failure analysis, it offers high resolution, sample versatility, and a user-friendly interface. The Prisma E SEM is the successor to the highly acclaimed Thermo Scientific Quanta SEM.

Helios 5 Laser PFIB System

Combined focused ion beam milling and laser ablation tools

Thermo Scientific Helios 5 PFIB Laser Systems combine plasma focused ion beam milling with femtosecond laser ablation and SEM (scanning electron microscopy) imaging. This “TriBeam” combination enables high-resolution imaging and analysis with in situ ablation capability, offering remarkable material removal rates for fast millimeter-scale characterization at nanometer resolution. 

Helios Hydra DualBeam

PFIB SEM with multiple ion species for 3D EM and TEM sample preparation

The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) is a versatile multi-application tool that has four different ion species (argon, nitrogen, oxygen, and xenon), allowing you to choose the ions that provide the best results for samples including metals, batteries, fiber composites, and biological tissues. Great results start with sample preparation whether you are performing scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation, 3D materials characterization, or cellular cryo-tomography.

Helios 5 DualBeam

Sample preparation for TEM and STEM imaging or atom probe tomography, easy to use with advanced automation, capable of high-quality subsurface 3D characterization

Thermo Scientific Helios 5 DualBeam builds on the high-performance imaging and analysis capabilities of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of materials science researchers and engineers for a wide range of focused ion beam scanning electron microscopy (FIB-SEM) use cases – even on the most challenging samples. 

Helios 5 PFIB DualBeam

Plasma focused ion beam scanning electron microscope for TEM sample preparation including 3D characterization, cross-sectioning and micromachining

The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for materials science and semiconductor applications. For materials science researchers, the Helios 5 PFIB DualBeam provides large-volume 3D characterization, gallium-free sample preparation, and precise micromachining. 

Scios 2 DualBeam

Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization

The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. With innovative features designed to increase throughput, precision, and ease of use, the Scios 2 DualBeam is an ideal solution to meet the needs of scientists and engineers in advanced research and analysis across academic, governmental, and industrial research environments.

For Research Use Only. Not for use in diagnostic procedures.