UniQuant Software for Standardless XRF Analysis

• Sample preparation is usually minimal or not required.

• Analyzes up to 79 elements from Boron to Americium or their oxide compounds.

• For each analysed element, UniQuant reports the Standard Deviation (Sigma) in ppm.

• Supports analysis of samples in variety of physical forms, including multi-element solids, pressed powder with binder, small samples on supporting film, liquids or filter aerosol samples, and others.

• Reports in weight percentage along with an estimated error for each element with reliable results.

• For trace analysis, corrects for background, spectral impurities, spectral line overlaps, matrix effects and certain physical effects.

• At high power analyses are done in less than 14 minutes; samples belonging to a known family, requiring fewer measuring channels, may be analyzed in 5 minutes.

• For specific applications where very high accuracy is required, UniQuant Software may use a specially-calibrated data set.

Thin Layer Samples

• Mono-layer samples: UniQuant Software can calculate the sample mass along with its associated standard deviation concurrently with the composition of the layer; if the layer is on a substrate with elements that are also in the layer, UniQuant Software can take their effect into account.

Interactivity

• User interface designed for minimum number of key strokes or mouse clicks to perform an operation.
• Facilitates rapid changes in assumptions (e.g. sulfides v. oxides) for composition determinations of an unknown sample.

Batch Modes

• For evaluation of calibration (set-up) samples as well as for evaluating a suite of unknown samples.
• Samples are “tagged” in a directory and the process is started.