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Transmission electron microscopy techniques using the Spectra TEM
From imaging your samples in high resolution to discovering chemical composition at atomic scale, Thermo Scientific Spectra Scanning Transmission Electron Microscopes support a variety of techniques to help you better understand every aspect of your materials.
HRTEM and HRSTEM imaging
Transmission electron microscopy is invaluable for characterizing the structure of nanoparticles and nanomaterials. High-resolution STEM and TEM enable atomic-resolution data along with information on chemical composition.
Differential phase contrast imaging
Modern electronics research relies on nanoscale analysis of electric and magnetic properties. Differential phase contrast scanning transmission electron microscopy (DPC-STEM) can image the strength and distribution of magnetic fields in a sample and display the magnetic domain structure.
TEM imaging modes for magnetic structures
Lorentz scanning transmission electron microscopy modes enable imaging of magnetic materials without compromising the magnetic structure of the sample. It can be performed either in transmission electron microscopy or scanning transmission electron microscopy mode with extremely high resolution and true field-free conditions across the entire sample.
Lorentz ptychograph of FeGe thin film acquired with a residual field of 130 mT, courtesy of Prof. D. Muller, Cornell University. Scale bar equals 50 nm.
Energy dispersive spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for electron microscope observations. With energy dispersive spectroscopy, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
Atomic-scale elemental mapping using energy-dispersive spectroscopy
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
3D EDS tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
Segmented surface rendering of nanoparticles with elements present: Ag core, Platinum shell (to increase visibility, the Platinum shells have been colored semitransparent).
Electron energy loss spectroscopy
Materials science and semiconductor research benefits from high-resolution EELS for a wide range of analytical applications. This includes high-throughput, high signal-to-noise-ratio elemental mapping, light element detection, chemical bonding information, as well as probing of oxidation states and surface phonons.
Atomically resolved EELS elemental mapping of LaMnO3/LaFeO3 interface.
In situ transmission electron microscopy
Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.
Automated Particle Workflow for nanoparticle analysis
The Thermo Scientific Automated Particle Workflow is a transmission electron microscopy workflow for nanoparticle analysis that offers large-area, high-resolution imaging and data acquisition at the nanoscale with on-the-fly processing.
TEM metrology
Spectra Scanning Transmission Electron Microscopes generate highly reliable, repeatable TEM and STEM images suitable for precision semiconductor metrology applications.
For Research Use Only. Not for use in diagnostic procedures.