DualBeam Focused Ion Beam-Scanning Electron Microscope systems (FIB-SEMs) provide for site-specific material removal, with the SEM then providing non-destructive imaging of the exposed sub-surface features. Our FIB-SEMs are capable of producing ultra-thin samples for S/TEM and creating fully functional nanoscale prototype devices.
Helios NanoLab DualBeam for Materials Science
The Helios NanoLab DualBeam is designed to deliver multi-scale, multi-dimensional insights, down to sub-nm resolution, to let researchers visualize the finest details of their sample.
Product models
Helios G4 UC for Materials Science
Helios G4 PFIB UXe DualBeam for Materials Science
Helios G4 PFIB CXe DualBeam for Materials Science
Helios G4 FX DualBeam for Materials Science
Helios G4 UX DualBeam for Materials Science
Helios G4 CX DualBeam for Materials Science
Available for: Materials Science Research
Helios NanoLab DualBeam for Semiconductors
The Helios NanoLab DualBeam is a highly flexible platform delivering both high productivity TEM sample preparation and high performance low kV imaging for advanced logic and memory device analysis.
Product models
Helios G4 PFIB UXe DualBeam for Semiconductors
Helios G4 PFIB HXe DualBeam for Semiconductors
Helios G4 PFIB CXe DualBeam for Semiconductors
Helios G4 HX DualBeam for Semiconductors
Helios G4 FX DualBeam for Semiconductors
Helios NanoLab 1200AT DualBeam for Semiconductors
Available for: Semiconductors Research
The Thermo Scientific Scios DualBeam is an ultra-high-resolution analytical DualBeam system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material. With innovative features designed to increase throughput, precision, and ease of use, our Scios DualBeam is ideal for advanced research and analysis across academic, government, and industrial research environments.
Available for: Materials Science Research
