Optimized dynamic LSM platform
- Performance optical path for best imaging
- Architecture supports automated test equipment (ATE) docking and back-side (B/S) analysis
- Mobility for the lab; high power cooling options
Best-in-class performance
- Laser voltage probing (LVP) and laser voltage imaging (LVI) for timing and functional analysis
- Dynamic laser simulation (DLS) for critical path analysis
- Powerful and easy-to-use Sierra Software GUI
Dynamic electrical fault isolation
- Transistor- and cell-level fault localization
- Isolate design-process marginalities
- Based on Ruby optics