Thermo Scientific™

ESCALAB™ XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe

Catalog number: SID-10148252
Thermo Scientific™

ESCALAB™ XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe

Catalog number: SID-10148252

Meet your demands for increased analytical performance and flexibility with the Thermo Scientific™ ESCALAB™ XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe, which combines high sensitivity with high resolution quantitative imaging and multi-technique capability.

 
Catalog Number
SID-10148252
Unit Size
Each
Analyzer Type
180° double-focusing, hemispherical analyzer with dual detector system
Depth Profiling
EX06 Ion Source
Sampling Area
50 x 20 mm
Price (USD)
Full specifications
Sampling Area50 x 20 mm
X-Ray Spot Size200 to 900 μm
Technique OptionsUV lamp for UPS, field emission electron source for AES/SEM, Twin anode non-monochromated X-ray source
Analyzer Type180° double-focusing, hemispherical analyzer with dual detector system
Depth ProfilingEX06 Ion Source
X-Ray Source TypeMonochromated, Micro-focused Al K-Alpha
Optional AccessoriesMAGCIS, UV lamp for UPS, field emission electron source for AES/SEM, Twin anode non-monochromated X-ray source, Platter camera
Item DescriptionESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
Sample Preparation OptionsHeat/cool sample holder, additional preparation chamber, bakeable 3-gas admission manifold, fracture stage, high pressure gas cell, sample parking facility
Thickness (Metric) Max. Sample12mm
Vacuum System2x turbo molecular pumps for entry and analysis chambers, Auto-firing, 3 filament TSP
Unit SizeEach
Showing 1 of 1
Catalog NumberSpecificationsUnit SizeAnalyzer TypeDepth ProfilingSampling AreaPrice (USD)
SID-10148252Full specifications
Each180° double-focusing, hemispherical analyzer with dual detector systemEX06 Ion Source50 x 20 mmRequest A Quote
Sampling Area50 x 20 mm
X-Ray Spot Size200 to 900 μm
Technique OptionsUV lamp for UPS, field emission electron source for AES/SEM, Twin anode non-monochromated X-ray source
Analyzer Type180° double-focusing, hemispherical analyzer with dual detector system
Depth ProfilingEX06 Ion Source
X-Ray Source TypeMonochromated, Micro-focused Al K-Alpha
Optional AccessoriesMAGCIS, UV lamp for UPS, field emission electron source for AES/SEM, Twin anode non-monochromated X-ray source, Platter camera
Item DescriptionESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
Sample Preparation OptionsHeat/cool sample holder, additional preparation chamber, bakeable 3-gas admission manifold, fracture stage, high pressure gas cell, sample parking facility
Thickness (Metric) Max. Sample12mm
Vacuum System2x turbo molecular pumps for entry and analysis chambers, Auto-firing, 3 filament TSP
Unit SizeEach
Showing 1 of 1

Equipped with a micro-focusing X-ray monochromator designed to deliver optimum XPS performance, the ESCALAB XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe ensures maximum sample throughput. The multi-technique capability and availability of a range of preparation chambers and devices provides the solution to any surface analytical problem. Using the advanced Avantage data system for acquisition and data processing, maximum information is extracted from the data.

The ESCALAB XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe Features:

  • High sensitivity spectroscopy
  • Small area XPS
  • Depth profiling capability
  • Angle resolved XPS
  • Ion scattering spectroscopy (ISS) in base system
  • Reflected electron energy loss spectroscopy (REELS) in base system
  • “Preploc” chamber in base system
  • Multi-technique analytical versatility
  • Many sample preparation options
  • Automated, unattended analysis
  • Multiple sample analysis

X-ray Monochromator

  • Twin-crystal, micro-focusing monochromator has a 500mm Rowland circle and uses an Al anode
  • Sample X-ray spot size is selectable over a range of 200 to 900μm

Lens, Analyzer and Detector

  • Lens/analyzer/detector combination makes the ESCALAB XI+ XPS Spectrometer unique for both imaging and small area XPS
  • Two types of detectors ensures optimum detection for each type of analysis — two-dimensional detector for imaging and a detector based on channel electron multipliers for spectroscopy when high count rates are to be detected
  • Lens is equipped with two, computer-controlled iris mechanisms — one allows the user to control the field of view of the lens down to <20μm for small area analysis and the other to control the angular acceptance of the lens, which is essential for high-quality angle resolved XPS
  • 180° hemispherical energy analyzer

Depth Profiling

  • Digitally-controlled EX06 ion gun is a high-performance ion source even when using low energy ions
  • Azimuthal sample rotation is available
  • Multi-technique capability
  • Other analytical techniques accommodated without compromise to the XPS performance
  • Reverse power supplies for the lenses and analyzer using the EX06 ion gun (ion scattering spectroscopy (ISS) is always available)
  • Electron gun can be operated at up to 1000V and provides an excellent source for REELS

Technique Options

  • XPS with non-monochromatic X-rays
  • AES (Auger electron spectroscopy)
  • UPS (Ultra-violet photoelectron spectroscopy)

Vacuum System

  • 5mm thick mu-metal analysis chamber maximizes efficiency of magnetic shielding
  • Increased effectiveness compared to shielding methods that use internal or external shields

Sample Preparation

  • Combined entry lock and preparation chamber form part of the base system
  • Additional preparation chambers are available

Avantage Data System

  • Integrates all aspects of the analysis, including instrument control, data acquisition, data processing and reporting
  • Allows remote control and easy interfacing to third-party software such as Microsoft Word
  • Manages total analysis process from sample to report

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