Thermo Fisher Scientific Presentations at M&M 2026

Automated 4D-STEM workflow for strain analysis and orientation mapping
Conference Session: Advanced TEM analysis for Semiconductors  
 

Time: 2:30 p.m. to 2:45 p.m.
Speaker: Yu Chu-Ping
 

EDS characterization of transition metal L-lines at varying beam energies with implications for the analysis of minerals
Poster Session: Quantitative Microanalysis of Terrestrial and Planetary Samples by Electrons, X-rays, Ions, and Lasers
 

Time: 3:00 p.m. to 5:30 p.m.

Speaker: Stephen Seddio

 

AI-driven image analysis workflows for life sciences
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 3:00 p.m. to 3:30 p.m.

Speaker: Arsalan Zolfaghari

Gain practical insights into AI-based approaches for microscopy image analysis using Thermo Scientific™ Amira™ Software. Attendees will learn how image enhancement, automated segmentation, 3D visualization, and quantitative analysis can be applied across cryo-ET, volume EM, and fluorescence microscopy datasets. Real-world life sciences examples will illustrate methods for studying organelle morphology, filament organization, viral particle distribution, and cellular ultrastructure with greater speed, reproducibility, and confidence.

Merge information from different data types for materials characterization

In-Booth Presentation
 

Location: M&M Exhibit Hall, Booth #204

Time: 3:30 p.m. to 4:00 p.m.

Speaker: Rengarajan Pelapur

In Thermo Scientific™ Avizo™ Software, you can combine and process data from different sources and connect the information that they carry.

In this presentation, you will see registered imaging and spectroscopy data for a multi-channel correlative visualization of 3D imaging and spectroscopy acquisition as well as an example of how to transfer information across different imaging techniques. We’ll demonstrate how AI completes the picture with multiple data types used as ground truth in training predictive models for materials analysis.

Redefining microscopy workflows with automation and AI
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 12:30 p.m. to 1:30 p.m.

Speaker: Rogier Miltenburg

Does automation and AI in microscopy still feel like a black box? Join us for an exclusive presentation showcasing the next generation of automated capabilities across Thermo Scientific™ electron microscopes.

Discover how advanced automation is transforming workflows by streamlining tasks that have traditionally required expert users. Learn how these innovations improve data quality, enhance instrument accessibility, increase utilization, and boost productivity across the laboratory.

By making complex procedures routine and reproducible, automation helps users of all experience levels achieve consistent, high-quality results. The outcome is greater confidence in your data, reliable answers, and optimal performance—every time, regardless of the operator.

Enhanced light element sensitivity and throughput enabled by a new pulse processor design in super-X G3
Conference Session: Correlative, Multimodal Microscopy, Spectroscopy, and Imaging

Time: 2:30 p.m. to 2:45 p.m.

Speaker: Austin Wade
 

Progress in field-free magnetic imaging on Thermo Scientific transmission electron microscopes
Poster Session: Advances in 4D STEM experimentation, analysis and interpretation

Time: 3:00 p.m. to 5:30 p.m.

Speaker: Ricardo Egoavil

From targeting to tomograms: Streamlining cryo-ET workflows with automated cryo-FIB
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 3:00 p.m. to 4:00 p.m.

Speaker: Christian Lamberz

Cryo-ET promises unprecedented insight into biology in its native cellular context, yet sample preparation and targeting remain key bottlenecks. Join us to discover how integrated fluorescence targeting, automated cryo-FIB milling, and streamlined cryo-ET workflows are helping researchers improve throughput, enhance reproducibility, and generate more tomograms with biologically relevant content. Learn how these advances are driving a deeper understanding of biological mechanisms at the nanoscale and empowering scientists to make more confident research decisions. Featuring a case study on enterovirus replication and practical guidance on selecting the right cryo-FIB for your research, this presentation will demonstrate how automated workflows can accelerate the path from biological questions to meaningful discoveries.

From alerts to action: Smarter cryo-EM support
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 4:00 p.m. to 4:30 p.m.

Speaker: Arjen Monden

Direct alerting adds a proactive layer to established service support for cryo-electron microscopy applications by notifying you when action is needed to prevent sample loss, wasted time, or disrupted workflows. As cryo-EM workflows become increasingly automated, systems often run unattended for long periods, making timely awareness more critical. In this talk, we will show how targeted notifications help laboratories respond to important instrument or workflow events before they become costly problems. Academic research labs and pharma environments both benefit by protecting valuable samples, improving productivity, and supporting confidence in high-value cryo-EM experiments without replacing the reactive support customers still rely on.

Success through partnership: Connecting customers to outcomes
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 4:30 p.m. to 5:00 p.m.

Speaker: Michelle Plue

What does a customer success manager (CSM) do, and how do they help you achieve success? This presentation highlights how CSMs serve as trusted advocates, leveraging Connected Care Portal insights, proactive maintenance planning, and productivity-focused reviews to improve instrument reliability, uptime, and operational outcomes. We will share real-world success stories demonstrating how CSM engagement drove measurable value through data-driven recommendations and proactive support. We’ll also discuss how a CSM successfully de-escalated a customer issue, building trust and strengthening the relationship.
 

Investigating spatial and temporal dynamics of intracellular enterovirus replication by automated high-throughput FIB-milling and cryo-electron tomography
Conference Session: Technical Advances and Transformative Applications of Cryo-EM
 

Time: 9:00 a.m. to 9:15 a.m.

Speaker: Christian Lamberz
 

Next-generation S/TEM platforms for semiconductor pathfinding: an integrated multi-modal and multi-dimensional approach for advanced logic and memory devices
Conference Session: Advanced TEM analysis for Semiconductors

Time:  8:30 a.m. - 9:00 a.m.

Speaker: Dominique Delille
 

From offline analysis to live feedback: scripting workflows for live field mapping in lorentz STEM
Conference Session: Recent developments and new emergent applications in hardware, accessories, and software tools

Time: 11:30 a.m. to 12:00 p.m.

Speaker: Austin Wade
 

Thermal risk management in FIB processing of sensitive materials
Conference Session: Advances in Focused Ion Beam Instrumentation, Applications, and Techniques for Materials and Life Sciences

Time: 2:30 p.m. to 2:45 p.m.

Speaker: Chengge Jiao

Maximizing information extraction from semiconductor devices through multimodal spectroscopy and 3D STEM
In-Booth Presentation

Location: M&M Exhibit Hall, Booth #204
Time: 3:00 p.m. to 4:00 p.m.
Speaker: Dominique Delille

Advanced semiconductor devices require characterization approaches that maximize information extraction from a single specimen. In this presentation, we highlight complementary workflows for advanced analytical and structural characterization of semiconductor devices using simultaneous spectroscopy and three-dimensional STEM imaging.

First, we will demonstrate simultaneous electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy acquisition for multimodal analytical characterization. The second part of the presentation focuses on three-dimensional STEM characterization of advanced semiconductor logic devices. 

Rapid prototyping adaptive electron microscopy workflows with AI-Assisted programming
Poster Session: Automation in Microscopy from Image Acquisition to Image Analysis, Data Visualization, and Management

Time: 3:00 p.m. to 5:30 p.m.

Speaker: Remco Geurts
 

Extending the aberration-free field of view in high-resolution TEM
Poster Session: Recent developments and new emergent applications in hardware, accessories, and software tools

Time: 10:00 a.m. to 12:00 p.m.

Speaker: Dileep Krishnan