Perform Like a PRO: Fast ICP-OES Analysis with the Latest Advances

Inductively coupled plasma–optical emission spectroscopy (ICP-OES) is one of the major techniques used for trace elemental analysis. However, the technique is not without its limitations, which include:

• The ability to analyze high matrix samples restricted to radial only instruments
• Speed is typically achieved by a compromise in sensitivity
• Improvements in sensitivity are achieved through the use of accessories, which add complexity

This webcast will focus on the most recent advances in ICP-OES that address these challenges and ensure that they are no longer barriers to your elemental analysis.

Key learning objectives

• Understand how to analyze high-matrix samples on both radial and duo ICP-OES systems without compromising data
• Learn how simultaneous ICP-OES systems coupled with advanced CID detections can achieve high sample throughput without effecting sensitivity
• Explore options for increasing sensitivity without the need the for additional accessories

Who should attend

• Lab managers and analysts that have specific analytical challenges with interferences
• Researchers that want to be ready for future challenges in trace elemental analysis
• Lab leaders who want to leverage the full potential of their instrument

Register to view the free
on-demand webinar

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