The three modes offered are:
'Background exclusion workflow'
The background exclusion workflow allows users to generate DDMS
n data with automatic application of instrument generated background exclusion list. This allows detection of low level analytes in the presence of a complex background.
'Background exclusion and component inclusion workflow'
The background exclusion and component inclusion workflow allows DDMS
n data generation with automatic application of instrument generated inclusion and exclusion list. Multiple samples can be submitted in one sequence for their respective inclusion and exclusion list generation followed by one identification experiment using those lists.
'Deep scan workflow'
The deep scan workflow allows the generation of DDMS
n data with automatic application of inclusion and exclusion lists followed by automated re-injection of the sample. The inclusion and exclusion lists are updated prior to re-injection by moving triggered targets from the inclusion list to the exclusion list allowing deeper interrogation of complex samples.
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Mass Spectrometry Support Center.