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Key learning objectives:
- How developments in new instrument design make collecting data easier
- Why using more than one surface analysis technique increases your understanding of a sample
- How automation helps smoothen multi-technique surface analysis
Presenter:
Robin Simpson, EngD
Robin Simpson is one of the application scientists in the surface analysis team at Thermo Fisher Scientific. In this role Robin is involved in system demonstrations, customer training and the production of marketing content for the surface analysis products. He joined the team in 2017 but had close links to the team for four years prior to that while he was undertaking his engineering doctorate at the University of Surrey. During this time his thesis involved the investigation of the effects of Ar cluster depth profiling on varied material surfaces using the MAGCIS ion source.
More information
Access the Q&A report
Application note: Multi-technique composition, coverage and band gap analysis of ALD-grown ultra thin films
White paper: The Surface Analysis Toolbox
Application note: Multi-technique surface analysis of mineral oxides species
Application note: Multi-technique surface characterization of organic LED material
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