When manufactured products fail unexpectedly, failure analysis becomes essential for manufacturers and service laboratories to determine the root cause. Failure can occur at all stages of the components' production and can happen for various reasons. The choice and quality of a material is of high importance. Additionally, high accuracy and short time-to-results are critical when characterizing a large amount of samples.
Scanning Electron Microscopy (SEM) is the tool of choice for rapid analysis of components. SEM together with Energy Dispersive X-ray Spectroscopy (EDS), is a strong solution for both morphological analysis and chemical characterization.
In this webinar, join Alice Scarpellini and Rogier Miltenburg of Thermo Fisher Scientific, as they reveal more about the analysis of unique automotive, ceramics, steel and plastic samples, including the root cause analysis of failures. This webinar will also introduce the latest Thermo Fisher Scientific technologies that bring speed and simplicity to failure analysis.
Key learning objectives:
Who should attend?
Applications and product specialist Thermo Fisher Scientific
During his master's in biomedical engineering, Rogier Miltenburg first became acquainted with SEM. He has been involved in SEM ever since and now enables users to quickly collect accurate results by continuously improving SEM/EDS and its software solutions. He is always looking for opportunities to make SEM/EDS analysis faster, easier and more reliable than ever.
Applications development scientist Thermo Fisher Scientific
Alice Scarpellini earned her M.S. in biomedical engineering at the University of Genoa with a thesis on the production, development, and SEM characterization of microelectrodes. She has 10 years of experience in a wide range of electron microscopy techniques and joined Thermo Fisher Scientific as an applications development scientist to support the SEM business.
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