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Learn about 4D STEM
These educational courses and hands-on sessions are designed to provide a comprehensive and practical understanding of 4D STEM, ranging from the fundamentals to advanced techniques and applications. Whether you’re new to 4D STEM or looking to enhance your skills, this series will help you learn how to optimize your acquisition settings for techniques like phase and orientation mapping, strain field measurement, and even spatial resolution improvement.
In this short course on 4D-STEM data acquisition, Dr. dos Reis will discuss the essentials of gathering and analyzing complex datasets for materials exploration and provide an overview of 4D-STEM principles, key data collection techniques (including phase mapping, strain mapping, DPC, and ptychography), and advanced analysis methods. With a focus on detector selection, beam settings, scanning approaches, and efficient data management, the course will help you learn how to effectively use 4D STEM and sophisticated analysis tools to meet your research goals.
Roberto dos Reis, Northwestern University
Dr. Roberto dos Reis earned a PhD in physics from Universidade Federal do Rio Grande do Sul/Brazil and completed a postdoc at NCEM/Molecular Foundry in Berkeley, CA. He joined Northwestern University and NUANCE center in 2018 as a research assistant professor, where he contributed to collaborations and research in advanced characterization utilizing scanning transmission electron microscopy. At NUANCE, he was responsible for the introduction and adaptation of direct electron detectors (DEDs), aligning with the center's goal of employing hybrid systems and AI in EM dataset analysis. Furthermore, Dr. dos Reis played a role in implementing 4D STEM techniques with the integration of ML methods, aiming to bridge the gap between traditional microscopy techniques and modern data analysis approaches.
In this practical session, you will learn how to set up experiments for four essential 4D-STEM applications: COM/DPC, orientation mapping, ptychography, and strain mapping. The workshop offers step-by-step guidance on experiment configurations, including beam alignment and detector settings, tailored to each technique. The course will help you learn how to optimize conditions for accurate data collection across these key methods, with a focus on practical implementation and achieving high-quality results.
Lee Casalena, Thermo Fisher Scientific, Hillsboro NanoPort
Dr. Lee Casalena is a senior product specialist for materials science transmission electron microscopy at Thermo Fisher Scientific. Lee brings a rich background in microscopy and materials characterization experience, including five years as a TEM field applications scientist. Lee completed his PhD in materials science and engineering at the Ohio State University with Professor Michael J. Mills. His research focused on thermo-mechanical effects of multi-element additions to high-temperature shape memory alloy systems, with a focus on structural and chemical characterization of novel secondary phases and defect formations using TEM, including electron tomography and 4D-STEM. He has contributed multiple publications on these topics and received several awards for his research, including a presidential fellowship. He is currently based out of Portland, Oregon.
Xi Chen, Thermo Fisher Scientific, Hillsboro NanoPort
Dr. Xi Chen is an application scientist at Thermo Fisher’s Hillsboro NanoPort. She has six years of experience in transmission electron microscopy with a background in materials science. She earned her PhD in James LeBeau’s group at the Massachusetts Institute of Technology.
This course explores the landscape of detectors and cameras in the context of 4D-STEM applications. By providing insights into selecting the right equipment for different use cases, it will help you make informed choices for your experimental setting.
Jo Verbeeck, EMAT Belgium
Dr. Jo Verbeeck co-leads the EMAT group with a diverse international population of over 80 researchers at the top of international research in electron microscopy for materials science. He became professor in electron microscopy at the University of Antwerp in 2013 and was promoted to full professor in 2018. Professor Verbeeck leads a subgroup currently consisting of seven PhD students and six postdocs. He has published over 300 papers and is regularly invited to speak at international conferences. Professor Verbeeck focuses on analytical spectroscopy, revealing the chemical and electronic structure of materials down to the atomic scale. He actively develops novel measurement setups and codes further extending the capabilities of electron microscopes.
This session will focus on the advanced techniques of ptychography and COM analysis in 4D STEM. Starting with an overview of 4D STEM's conventional imaging modes (ADF, ABF, DPC, and iDPC), we'll delve into the specifics of WDD ptychography, emphasizing its applications for thin samples, live reconstruction, and the single-side band method. The workshop will also introduce iterative ptychography, particularly ePIE-based approaches, suited for thin samples, low dose conditions, and extensive fields of view. You will learn about multi-slice electron ptychography for 3D imaging with a focus on light elements and quantitative analysis. This session aims to provide a concise yet comprehensive exploration of ptychography and COM analysis techniques, helping you develop the skills to apply these advanced methods in your 4D-STEM research.
Dr. Zhen Chen, Institute of Physics, University of Chinese Academy of Sciences, China
Professor Zhen Chen earned his PhD from the Institute of Physics, Chinese Academy of Sciences, in China and completed postdoctoral work at Monash University and Cornell University. Before joining the Institute of Physics, he was an associate professor at Tsinghua University. His research interests include the development of new electron microscopy techniques, especially 4D-STEM. His group also focuses on applications of advanced microscopy techniques in functional materials. He has published more than 50 papers, including those that hold the Guinness World Record for resolution (twice).
This session will move through the essentials of using LiberTEM for 4D-STEM analysis, starting with a quick setup of LiberTEM. You will then be guided through the basics of the LiberTEM web interface, learning to navigate and utilize the platform effectively. The session also covers the use of Jupyter notebooks for advanced 4D-STEM applications, providing insights into executing complex analyses. Dr. Weber will also highlight interoperability to showcase the platform's versatility.
Dieter Weber, Forschungszentrum Jülich, Germany
Dr. Dieter Weber works at the Ernst Ruska Centre (ER-C) at Forschungszentrum Jülich as group leader for data and software. Activities include high-speed live and offline processing with the LiberTEM project, 4D STEM, data management, and automation. He earned a PhD in materials science at Forschungszentrum Jülich.