Electron microscopy

Electron microscopes use a beam of electrons to create an image of your specimen, helping you visualize structures from microns down to the molecular and atomic levels. Scanning electron microscopes (SEMs) scan a focused beam of electrons across the surface of a specimen and capture the scattered electrons to reveal surface topography, contrast, and compositional information. Focused ion beam-scanning electron microscopes (FIB-SEMs) combine the capabilities of both a focused ion beam (FIB) system and a SEM in a single platform for both precise material modification and high-resolution imaging. Transmission electron microscopes (TEMs) transmit a beam of electrons through a very thin specimen to image the internal structure of the specimen and fine details, such as atomic arrangements and crystal structures.

In materials research, electron microscopy is used to analyze the microstructure of metals, ceramics, polymers, and composites. It helps in studying the morphology of surfaces and fractures, identifying and characterizing defects within materials, and investigating grain boundaries and interfaces.

In life sciences research, electron microscopy helps researchers study the structural organization of proteins and biomolecular complexes, cells, tissues, and whole organisms, providing detailed insights across scales that advance understanding of biological complexity, disease mechanisms, and drug discovery.

In semiconductor analysis, electron microscopy is essential for inspecting complex semiconductor devices and architectures. It enables analysis of the structure of transistors and other device components, as well as identification of defects and impurities within semiconductor materials.