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XPS instrument overview
For over 50 years, Thermo Fisher Scientific has provided surface analysis instruments to academic and industrial customers. Our instruments deliver the performance required for cutting-edge materials science research, product development, and failure analysis. Our diverse portfolio is designed to cater to various applications, accommodating routine, high-throughput measurements, as well as complex experimental workflows.
K-Alpha X-Ray Photoelectron Spectroscopy System
X-ray photoelectron spectrometer for high-performance surface analysis.
The Thermo Scientific K-Alpha XPS System introduces a fresh approach to surface analysis. It offers a streamlined workflow and user-friendly operation while maintaining high-quality results and advanced capabilities.
Key features
- High-throughput XPS
- Fast, efficient, automated workflow
- Ion source for depth profiling
Nexsa G2 Surface Analysis System
X-ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities.
The Thermo Scientific Nexsa G2 XPS System offers fully automated, high-throughput surface analysis. It integrates XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy for true correlative analysis. With options for sample heating and biasing, it expands the range of possible experiments.
Key features
- High-performance XPS
- Integrated multi-technique options
- Optional dual-mode ion source for monoatomic and
cluster ion depth profiling
ESCALAB QXi X-Ray Photoelectron Spectroscopy Microprobe
Multi-technique surface analysis instrument with high-resolution X-ray photoelectron spectroscopy and imaging.
The Thermo Scientific ESCALAB QXi XPS Microprobe is a highly flexible and configurable multi-technique instrument, offering exceptional sensitivity and rapid production of high-quality spectra. The system features a unique dual detector system that enables superb XPS imaging with excellent spatial resolution. XPS, ISS, and REELS are included as standard, and the instrument can be configured with optional HAXPES, AES, UPS, Raman, and IPES methods. Thermo Scientific Avantage Software seamlessly integrates system control, data acquisition, processing, and reporting.
Key features
- High spectral resolution
- Multi-technique surface analysis as standard
- Extensive sample preparation and expansion options
Specifications
| K-Alpha System | Nexsa G2 System | ESCALAB Microprobe |
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XPS instrument capabilities |
Large-area XPS |  |
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| Small-area XPS | |
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| XPS imaging | |
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| SnapMap | |
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| Charge compensation system for insulator analysis | |
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| Ion source for depth profiling | |
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| Angle-dependent XPS | Optional | Optional | |
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| Automated sample transfer | |
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Optional | |
| XPS instrument analytical options | Raman spectroscopy | Optional | Optional | |
| MAGCIS Ion Source | Optional | Optional | ||
| Reflected electron energy loss spectroscopy (REELS) | Optional | |
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| Low energy ion scattering spectroscopy (ISS/LEIS) | Optional | |
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| UV photoelectron spectroscopy (UPS) | Optional | Optional | ||
| Auger electron spectroscopy and EDS | Optional | |||
| Sample preparation options | Optional | Optional | ||
| Inert sample transfer | Optional | Optional | Optional | |
| Higher energy X-ray sources (HAXPES) | Optional |
For Research Use Only. Not for use in diagnostic procedures.