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Thermo Scientific™
Nexsa G2 Surface Analysis System
Catalog number: IQLAADGACKFAQUMBJN
Thermo Scientific™
Nexsa G2 Surface Analysis System
Catalog number: IQLAADGACKFAQUMBJN
The Thermo Scientific™ Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.
Find additional information here: Nexsa G2 Surface Analysis System
Find additional information here: Nexsa G2 Surface Analysis System
Catalog Number
IQLAADGACKFAQUMBJN
Unit Size
Each
Description
Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Price (USD)
| Sampling Area | 60 x 60 mm |
| X-Ray Source Type | Monochromated, Microfocused, low power Al K-Alpha |
| X-Ray Spot Size | 10 to 400 μm (adjustable in 5 μm increments) |
| Analyzer Type | 180° double-focusing, hemispherical analyzer with 128-channel detector |
| Depth Profiling | EX06 monatomic ion source or MAGCIS dual-mode ion source |
| Description | Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities |
| Optional Accessories | UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration |
| Thickness (Metric) Max. Sample | 20 mm |
| Vacuum System | Two turbo molecular pumps, with automated titanium sublimation pump and backing pump |
| Unit Size | Each |
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| IQLAADGACKFAQUMBJN | Each | Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities | Request A Quote | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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Powerful Performance from Standard Features:
- High-performance X-ray source
- Optimized electron optics
- Sample viewing
- Insulator analysis
- Digital Control
- NX sample heater module
Optional Upgrades: Add any of the integrated and fully automated techniques to your analysis. Run at the touch of a button.
- ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
- UPS: Ultraviolet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
- Raman: Spectroscopic technique used to in chemistry to provide a structural fingerprint
- REELS: Reflection electron energy loss spectroscopy
SnapMap
Bring sample features into focus with SnapMap's optical view. The optical view helps you pint point areas of interest quickly while developing a fully focused XPS image to further define your experiment.
1. X-rays illuminate a small area on the sample.
2. Photo electrons from that small area are collected and focused into the analyzer
3. Spectra are continually acquired as the stage is moving
4. Stage position monitored throughout data acquisition, positions used to generate SnapMap
Application Areas
- Batteries
- Biosurfaces
- Catalysts
- Ceramics
- Glass coatings
- Graphene
- Metals & oxides
- Nanomaterials
- OLEDs
- Polymers
- Semiconductors
- Solar cells
- Thin films
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