Scios 2 DualBeam provides:
Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The latest technological innovations of the Scios 2 DualBeam, in combination with the easiest-to-use, most comprehensive AutoTEM™ 4 software (optional) and Thermo Fisher Scientific’s application expertise, allow for fast and easy preparation of site-specific HR-S/TEM samples for a wide range of materials. In order to achieve the high-quality results, final polishing with low-energy ions is required to minimize surface damage on the sample. The Sidewinder HT Focused Ion Beam (FIB) column not only delivers high-resolution imaging and milling at high voltages but has also good low-voltage performance, enabling the creation of high-quality TEM lamella.