Apreo ChemiSEM System Applications

Comprehensive materials analysis for demanding applications

Characterization of high-temperature corrosion and particle analysis of single crystal René N5 superalloy

ChemiPhase characterization shows the different phases identified on the sample surface.
Perception Software particle maps showing selected feature locations.

Comprehensive characterization of precipitates, dispersoids, and microstructure of aluminum alloys

Bright field imaging (A) and ChemiPhase characterization (B) of nanoscale particles in the AA2024-T3 sample.
AA2024 sample subjected to the T3 aging treatment. Various intermetallic particles are differentiated through a combination of backscattered electron contrast imaging (A) and ChemiPhase analysis (B). Different colors in the ChemiPhase map represent distinct phases. (The phase related to the base alloy has been hidden to focus on the intermetallic particles.) The table shows quantification of the observed phases; compounds identified in the literature have been easily assigned to specific intermetallic particles.
Top) Low-magnification BSE images showing the area of each sample that was analyzed with EBSD. Bottom) Inverse pole figure orientation maps reveal the different crystallographic orientations (X, Y, Z) of the grains.

Correlative microscopy and AI-assisted analysis of thermal barrier coatings

Workflow integrating the CleanMill Ion Beam, ChemiSEM Technology, and Avizo Software for rapid preparation, imaging, and AI-assisted image analysis of thermal barrier coatings.
BSE (A) and ChemiSEM (B-D) images of the TBC top coat, showing the distribution of magnesium (B), zirconium (C), and oxygen (D).
Phase distribution maps and quantification of all the different materials automatically identified by ChemiPhase analysis.
(Top) Large-area image acquired with Maps Software. (Bottom) Phase analysis extended to a large area map, obtained as a result of the training of a convolutional neural network (CNN) in Avizo 3D Pro Software. After training on just a portion of this cross-section, the model could be extended to the entire SEM image.