Scios 3 FIB-SEM

Versatile FIB-SEM for high throughput performance with advanced automation

The Thermo Scientific Scios 3 FIB-SEM is an advanced, ultra-high-resolution analytical-focused ion beam scanning electron microscope (FIB-SEM). It excels in delivering exceptional sample preparation and 3D characterization for a wide range of samples, including magnetic and non-conductive materials. Designed with innovative features to enhance throughput, reliability, and ease of use, the Scios 3 FIB-SEM is an ideal solution for scientists and engineers conducting advanced research and analysis in diverse environments.

 

Combined with the full suite of automated software applications, Scios 3 FIB-SEM is tailored to facilitate most common use cases. This user-friendly and innovative solution significantly boosts productivity, making it valuable for users in both industry and academia.

Scios 3 FIB-SEM features

Automated cross-section analysis

The Scios 3 FIB-SEM offers an automated application for cross-section analysis, enabling high-quality subsurface characterization with precise targeting. It streamlines workflows, reduces user intervention, and ensures consistent, high-quality results in high-throughput environments.

High-throughput analytical 3D characterization

Thermo Scientific Auto Slice & View 5 Software for the Scios 3 FIB-SEM offers automated serial sectioning for high-throughput 3D analysis. Seamless integration enables multi-modal data collection, including SEM imaging, compositional, microstructural, and crystallographic information.

Automated, high-quality, site-specific (S)TEM sample preparation

The Scios 3 FIB-SEM enables fast and easy preparation of high-quality, site-specific (S)TEM samples. Combined with Thermo Scientific AutoTEM 5 Software, it’s possible to fully automate the workflow to deliver high-throughput, consistent sample preparation for a wide range of materials and devices.

Ultra-high-resolution imaging

The Scios 3 FIB-SEM features field-free electron optics for ultra-high-resolution imaging of challenging materials like magnetic or non-conducting samples. It provides clear, accurate visual data essential for detailed examination in research and industrial applications.

User-friendly interface

The Scios 3 FIB-SEM features an intuitive user interface that simplifies operation and reduces the learning curve. This design improvement increases productivity by enabling users to quickly master the system and focus on their research objectives.

Scios 3 FIB-SEM resources

To help ensure you get the most out of your Scios 3 FIB-SEM, we provide access to a wide range of resources, including detailed manuals, tutorials, and support documents. These resources are designed to help you maximize the system's capabilities and achieve your goals.

For Research Use Only. Not for use in diagnostic procedures.