Applications of focused ion beam scanning electron microscopy

The Thermo Scientific Scios 3 FIB-SEM is designed for advanced applications in material microstructure characterization, 3D materials analysis, and TEM sample preparation. Utilizing advanced FIB technology and innovative automation solutions Scios 3 FIB-SEM facilitates precise and efficient sample preparation and analyses even on complex materials. This makes Scios 3 FIB-SEM an essential tool for researchers seeking detailed insights into materials properties, composition, and structural integrity at the nanometer scale.


Material microstructure characterization with FIB-SEM

A basic application of FIB-SEM instruments is creating cross-sections, a fundamental application providing insights into materials' microstructure. By selectively removing material with FIB, hidden structures beneath the sample surface can be further examined with SEM or EDS, revealing details about structural properties, composition, and failure mechanisms.

 

Key factors for achieving high-quality cross-section preparation include the FIB column's ability to efficiently focus ions for fast and clean cuts. Complex or non-uniform samples may pose challenges, but the "rocking mill" technique, a software feature in all Thermo Scientific DualBeam systems, can aid in producing smooth surfaces without the need for additional hardware. Furthermore, fully automated preparation of multi-site cross-sections with multi-modal data acquisition is enabled by Thermo Scientific Auto Cross Section Software, streamlining operator and tool efficiency.

Cross section of the NMC particle used for LiO battery cathode fabrication.

FIB-SEM 3D analysis of materials, device structures, and defects

Three-dimensional characterization is often required to better understand the structure and properties of a sample. The Scios 3 FIB-SEM with optional Thermo Scientific Auto Slice & View 5 Software allows for high-quality, fully automated acquisition of multi-modal 3D datasets, including, among others, BSE imaging for maximum materials contrast, energy dispersive spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) to acquire microstructural and crystallographic information. Combined with Thermo Scientific Avizo Software, it delivers a unique workflow solution for high-resolution, advanced 3D characterization and analysis at the nanometer scale.

3D EDS reconstruction of a cycled lithium battery with carbon silicon anode.

Scanning transmission electron microscopy sample preparation

The Scios 3 FIB-SEM with Thermo Scientific AutoTEM 5 Software excels in automated TEM sample preparation, offering fast and precise preparation of high-quality, site-specific TEM samples. Its advanced milling and low-energy polishing techniques help ensure that samples are of very high quality, with minimal surface damage and optimal structural integrity. This capability is essential for researchers and engineers who require detailed and accurate TEM samples for their studies. The system's ability to produce high-quality TEM samples quickly and efficiently makes it an indispensable tool for advanced research.

High-quality TEM samples accessible even for novice users.

For Research Use Only. Not for use in diagnostic procedures.