Electron Microscopes

The Thermo Scientific™ Helios™ G4 PFIB HXe DualBeam™ System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.

The Helios G4 PFIB CXe DualBeam System enables you to: Reveal the finest details using best-in-class Elstar™ SEM Electron Column with high-current UC+ monochromator technology, enabling nanometer SEM image resolution and surface sensitivity.

Thermo Scientific™ Helios 5 PFIB CXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB CXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the Thermo Scientific™ Helios™ G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and...

Fastest high-quality sub-surface and 3D characterization at millimeter scale with nanometers resolution. The Thermo Scientific™ Helios™ 5 Laser PFIB delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining.

Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.

The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest...

The Thermo Scientific™ Helios™ G4 PFIB UXe DualBeam™ System provides unique capabilities to enable damage-free delayering of semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.

The Thermo Scientific™ Centrios™ Advanced Circuit Edit System enables rapid prototyping and first silicon debug and repair for 14 nm and above design rule devices. It enables advanced front and backside edits with unparalleled editing control and precision.

Featuring the new Thermo Scientific Celta Focused Ion Beam (FIB) Column, the Centrios HX System delivers high resolution at low beam currents and low landing energies, allowing you to perform edits accurately and with minimum circuit damage.

Find additional information here: Thermo Scientific™ Ceta™ The Thermo Scientific™ Ceta™ is a multipurpose, versatile camera suitable for high dose and low dose applications. Because of its all-round performance it is fit for multiple applications.

Find additional information here: Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) The Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete solution for high resolution, high throughput macromolecular structure...

The Thermo Scientific™ Talos L120C TEM is a 20-120 kV thermionic (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, cell organelles, asbestos, polymers, and soft...

The Thermo Scientific™ Temperature Controlled Sample Holder has been developed by Thermo Fisher Scientific and Deben in order to study vacuum-sensitive and vulnerable samples such as biological, food or organic coatings.

The Thermo Scientific™ Themis™ S S/TEM is an 80–200kV scanning / transmission electron microscope (S/TEM) designed for high-speed imaging and analysis of semiconductor devices. As the latest member of the industry-standard Themis family, the Themis S TEM inherits a unique combination of the best...