Carbon-based nanomaterials and other low-dimensional materials have promising application in a variety of industries including electronics and filtration. Research into these novel materials has produced increased interest in low-kV scanning transmission electron microscopy (STEM) due to the technique’s ability to produce images with atomic resolution. This capacity is, however, significantly impacted by radiation; beam-damage-free imaging can often only be achieved at low accelerating voltages below the knock-on damage threshold (typically under 60 kV).

At these low values, resolution-limiting aberrations can substantially undermine imaging efforts. Monochromation of the electron beam, or the use of a cold field emission gun, have proven to be reliable ways to reduce chromatic blurring. A probe corrector can further improve signal by reducing, or potentially even eliminating, aberrations at low accelerating voltages.

Thermo Fisher Scientific combines monochromation and probe correction in the Thermo Scientific Spectra S/TEM product line, offering an ideally suited solution for imaging 2D materials. With the Spectra S/TEM, accelerating voltages as low as 30 kV are possible due to the superior correction capability of the Thermo Scientific S-CORR Probe Corrector along with the Thermo Scientific CETCOR Image Corrector, which compensates for spherical aberrations.

2D graphene imaged with high-resolution STEM.

2D graphene imaged with high-resolution STEM.

Applications

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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(S)TEM Sample Preparation

DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for (S)TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.

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Imaging using HRSTEM and HRTEM

Transmission electron microscopy is invaluable for characterizing the structure of nanoparticles and nanomaterials. High-resolution STEM and TEM enable atomic-resolution data along with information on chemical composition.

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Differential Phase Contrast Imaging

Modern electronics research relies on nanoscale analysis of electric and magnetic properties. Differential phase contrast STEM (DPC-STEM) can image the strength and distribution of magnetic fields in a sample and display the magnetic domain structure.

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X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.

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(S)TEM Sample Preparation

DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for (S)TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.

Learn more ›

Imaging using HRSTEM and HRTEM

Transmission electron microscopy is invaluable for characterizing the structure of nanoparticles and nanomaterials. High-resolution STEM and TEM enable atomic-resolution data along with information on chemical composition.

Learn more ›

Differential Phase Contrast Imaging

Modern electronics research relies on nanoscale analysis of electric and magnetic properties. Differential phase contrast STEM (DPC-STEM) can image the strength and distribution of magnetic fields in a sample and display the magnetic domain structure.

Learn more ›

X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.

Learn more ›

Products

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Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Nexsa XPS

  • Tilt Module for ARXPS measurements
  • Dual-mode ion source for expanded depth profiling capabilities
  • Insulator analysis

K-Alpha XPS

  • Selectable area spectroscopy
  • Micro-focused monochromator
  • High-resolution chemical state spectroscopy

ESCALAB Xi+ XPS

  • High sensitivity spectroscopy
  • XPS with non-monochromatic X-rays
  • 180° hemispherical energy analyzer

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